Dynamic Voltage Adjustment in Semiconductor Devices for Temperature Stability
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Summary
Problems
Semiconductor apparatuses malfunction due to variations in transistor characteristics caused by temperature changes, despite constant internal voltages, leading to inconsistent current flow between the drain and source of transistors.
Innovation solutions
A semiconductor apparatus that includes a temperature code generation circuit, control code generation circuit, and reference voltage generation circuit to adjust internal voltages based on temperature variations by generating and comparing temperature codes before and after heating, and adjusting a reference voltage accordingly.
TRIZ Analysis
Specific contradictions:
General conflict description:
Principle concept:
If internal voltages are kept constant, then voltage stability is maintained, but transistor characteristics vary with temperature causing malfunction
Why choose this principle:
The patent implements dynamic voltage adjustment by switching between different reference voltage levels (first reference voltage and second reference voltage) based on temperature conditions. The voltage adjustment circuit changes the voltage level of internal voltages dynamically in response to temperature changes, allowing the system to adapt to varying temperature conditions while maintaining reliable transistor operation.
Principle concept:
If internal voltages are kept constant, then voltage stability is maintained, but transistor characteristics vary with temperature causing malfunction
Why choose this principle:
The patent changes the voltage level parameter of internal voltages based on temperature. When temperature exceeds a threshold, the system switches from a first voltage level to a second voltage level. This parameter change allows the transistor characteristics to be compensated for temperature variations, resolving the contradiction between voltage stability and temperature adaptability.
Application Domain
Data Source
AI summary:
A semiconductor apparatus that includes a temperature code generation circuit, control code generation circuit, and reference voltage generation circuit to adjust internal voltages based on temperature variations by generating and comparing temperature codes before and after heating, and adjusting a reference voltage accordingly.
Abstract
A semiconductor apparatus includes a control block that generates a first control signal, a second control signal, and a heating enable signal in response to an enable signal and a heating control signal, a temperature measurement block that generates a temperature code corresponding to temperature in response to the first and second control signals, a heater that generates heat while the heating enable signal is being enabled, a code latch block that stores the temperature code in response to the first and second control signals, and outputs a first code and a second code, a control code generation circuit that generates a signal by performing an operation on the first and second codes, and generates a control code by comparing the signal with a preset code, and a reference voltage generation circuit configured to change a voltage level of a reference voltage in response to the control code.