Close Menu
  • About
  • Products
    • Find Solutions
    • Technical Q&A
    • Novelty Search
    • Feasibility Analysis Assistant
    • Material Scout
    • Pharma Insights Advisor
    • More AI Agents For Innovation
  • IP
  • Machinery
  • Material
  • Life Science
Facebook YouTube LinkedIn
Eureka BlogEureka Blog
  • About
  • Products
    • Find Solutions
    • Technical Q&A
    • Novelty Search
    • Feasibility Analysis Assistant
    • Material Scout
    • Pharma Insights Advisor
    • More AI Agents For Innovation
  • IP
  • Machinery
  • Material
  • Life Science
Facebook YouTube LinkedIn
Patsnap eureka →
Eureka BlogEureka Blog
Patsnap eureka →
Home»TRIZ Case»Enhanced Thermal Control for Semiconductor Substrates

Enhanced Thermal Control for Semiconductor Substrates

May 25, 20263 Mins Read
Share
Facebook Twitter LinkedIn Email

Enhanced Thermal Control for Semiconductor Substrates

Want An AI Powered R&D Assistant ?
Here’s PatSnap Eureka !
Go to Seek

Summary

Problems

In rapid thermal processing of semiconductor substrates, achieving accurate temperature control and improved cooling rates is challenging due to interference from radiation from the heating source, which affects the accuracy of pyrometry measurements and prolongs the cooling process.

Innovation solutions

A filter, such as a reflective or absorptive window, is used to block specific wavelengths of radiation between the heating source and the substrate, preventing unwanted radiation from reaching the substrate during heating and cooling, thereby enhancing temperature control and cooling efficiency.

TRIZ Analysis

Specific contradictions:

heating efficiency
vs
temperature measurement accuracy

General conflict description:

Use of energy by moving object
vs
Measurement precision
TRIZ inspiration library
1 Segmentation
Try to solve problems with it

Principle concept:

If radiation from the heating source is allowed to reach the substrate during heating, then heating efficiency is improved, but temperature measurement accuracy deteriorates due to interference with pyrometry

Why choose this principle:

The radiation spectrum is segmented into different wavelength ranges. A filter is introduced to block specific wavelength ranges that interfere with pyrometry measurements while allowing other wavelength ranges to contribute to heating. This segmentation allows simultaneous optimization of heating efficiency and measurement accuracy by treating different spectral components separately.

TRIZ inspiration library
24 Intermediary (Mediator)
Try to solve problems with it

Principle concept:

If radiation from the heating source is allowed to reach the substrate during heating, then heating efficiency is improved, but temperature measurement accuracy deteriorates due to interference with pyrometry

Why choose this principle:

A filter is introduced as an intermediary component between the heating source and the substrate. This filter selectively transmits certain wavelengths while blocking others, thereby mediating the interaction between radiation and substrate to eliminate measurement interference while preserving heating effectiveness.

Application Domain

thermal control semiconductor substrates optical filters

Data Source

Patent US8548311B2 Apparatus and method for improved control of heating and cooling of substrates
Publication Date: 01 Oct 2013 TRIZ 电器元件
FIG 01
US08548311-D00000
FIG 02
US08548311-D00001
FIG 03
US08548311-D00002
Login to view Image

AI summary:

A filter, such as a reflective or absorptive window, is used to block specific wavelengths of radiation between the heating source and the substrate, preventing unwanted radiation from reaching the substrate during heating and cooling, thereby enhancing temperature control and cooling efficiency.

Abstract

Methods and apparatus for processing substrates and controlling the heating and cooling of substrates are described. A radiation source providing radiation in a first range of wavelengths heats the substrate within a predetermined temperature range, the substrate being absorptive of radiation in a second range of wavelengths within the first range of wavelengths and within the predetermined temperature range. A filter prevents at least a portion of radiation within the second wavelength range from reaching the substrate.

Contents

    Accelerate from idea to impact

    Eureka harnesses unparalleled innovation data and effortlessly delivers breakthrough ideas for your toughest technical challenges.

    Sign up for free
    optical filters semiconductor substrates thermal control
    Share. Facebook Twitter LinkedIn Email
    Previous ArticleFuel Pressure Control for Dual-Fuel Engines: Patent-Based Solution
    Next Article Conductive Protection for Gear Detection Reliability

    Related Posts

    Lift Assist System for Easier Foldable Roof Operation

    May 26, 2026

    Shaped Coils for Deep-Brain Magnetic Stimulation

    May 26, 2026

    Parking Brake Operation Stroke Reduction with Lever Design

    May 26, 2026

    Metamaterial Design for Directed Energy Protection

    May 26, 2026

    Memristive NDR Device for Adaptive Oscillator Circuits

    May 26, 2026

    Side Air Bag Design for Even Inflation and Safety

    May 26, 2026

    Comments are closed.

    Start Free Trial Today!

    Get instant, smart ideas, solutions and spark creativity with Patsnap Eureka AI. Generate professional answers in a few seconds.

    ⚡️ Generate Ideas →
    Table of Contents
    • Enhanced Thermal Control for Semiconductor Substrates
      • Summary
      • TRIZ Analysis
      • Data Source
      • Accelerate from idea to impact
    About Us
    About Us

    Eureka harnesses unparalleled innovation data and effortlessly delivers breakthrough ideas for your toughest technical challenges. Eliminate complexity, achieve more.

    Facebook YouTube LinkedIn
    Latest Hotspot

    US20120251581A1 — Cyclophilin A and HCV Replicon Activity Dataset: Structure–Activity Relationship (SAR) and Biological Activity Analysis

    June 3, 2026

    Vehicle-to-Grid For EVs: Battery Degradation, Grid Value, and Control Architecture

    May 12, 2026

    TIGIT Target Global Competitive Landscape Report 2026

    May 11, 2026
    tech newsletter

    35 Breakthroughs in Magnetic Resonance Imaging – Product Components

    July 1, 2024

    27 Breakthroughs in Magnetic Resonance Imaging – Categories

    July 1, 2024

    40+ Breakthroughs in Magnetic Resonance Imaging – Typical Technologies

    July 1, 2024
    © 2026 Patsnap Eureka. Powered by Patsnap Eureka.

    Type above and press Enter to search. Press Esc to cancel.