APR 7, 202660 MINS READ
Diamond carbon composite thermal materials are heterogeneous systems engineered to exploit the synergistic thermal properties of diamond particles or films and conductive matrices. The diamond phase, exhibiting thermal conductivity between 1000–2000 W/mK 2, serves as the primary heat conduction pathway, while the matrix—typically metals (Cu, Ag, Al) 2, ceramics (SiC) 15, or hybrid metal-ceramic systems 9—provides structural continuity, mechanical workability, and tailored thermal expansion matching to semiconductor substrates. The volume fraction of diamond critically determines composite performance: compositions with 40–90% diamond content achieve thermal conductivities of 300–620 W/(m·K) while maintaining coefficients of thermal expansion (CTE) in the range of 3×10⁻⁶/K to 13×10⁻⁶/K 91318, closely matching silicon (2.6×10⁻⁶/K) and GaN (5.6×10⁻⁶/K) to minimize thermomechanical stress during thermal cycling.
The microstructural architecture of diamond carbon composites can be categorized into three primary configurations:
The diamond phase itself may consist of natural or synthetic diamond particles, isotopically enriched ¹²C diamond (thermal conductivity up to 3300 W/(m·K) at room temperature) 4, polycrystalline diamond (PCD) with direct diamond-to-diamond bonding formed under high-pressure/high-temperature (HP/HT) conditions 15, or thermally stable silicon carbide diamond (SCD) composites where diamond grains are embedded in SiC without catalytic metals 15. Each diamond type presents distinct trade-offs: PCD offers superior abrasion resistance and toughness but degrades above 700°C due to catalytic graphitization by residual Co/Ni/Fe 15, whereas SCD maintains thermal stability beyond 1000°C and exhibits excellent hot hardness, making it suitable for high-temperature drilling and cutting operations 15.
The interfacial region between diamond and matrix phases represents the critical bottleneck for thermal transport in diamond carbon composites. Poor wettability between diamond (surface energy ~5 J/m²) and most metals (e.g., Cu: ~1.3 J/m², Ag: ~1.2 J/m²) results in interfacial voids, high thermal boundary resistance (Kapitza resistance), and mechanical delamination under thermal cycling 39. Advanced interfacial engineering strategies have been developed to address these challenges:
Coating diamond particles with carbide-forming elements from Group 4 of the periodic table (Ti, Zr, Hf) creates a chemically bonded carbide interlayer (TiC, ZrC) that enhances wettability and reduces oxygen contamination 3. For example, diamond particles coated with Ti and subsequently infiltrated with Ag or Ag alloys achieve oxygen contents below 0.1 mass%, eliminating oxide-induced porosity and achieving near-theoretical density (>98%) 3. The Ti-TiC dendritic interface structure formed during sintering provides mechanical interlocking and maintains thermal conductivity above 400 W/(m·K) even after 1000 thermal cycles between -55°C and 150°C 12.
Addition of 0.5–5 vol% Cr to Cu-Ag-diamond composites promotes formation of Cr₃C₂ and Cr₇C₃ compounds at diamond surfaces, significantly improving sinterability and adhesion 9. The Cr compound layer reduces interfacial thermal resistance by ~40% compared to untreated diamond-Cu interfaces, enabling thermal conductivities of 300 W/(m·K) in composites with 40–70 vol% diamond 9. A two-step processing route—initial firing at 850–950°C under vacuum followed by hot isostatic pressing (HIP) at 900–1000°C and 100–200 MPa—ensures full densification and uniform Cr distribution 9.
Boronization of diamond particles prior to Cu infiltration creates boron-carbon compounds (B₄C, BC₃) at the interface, enhancing adhesion and suppressing detrimental carbide formation 1318. Boronized diamond-Cu composites with 40–90 vol% diamond achieve thermal conductivities up to 620 W/(m·K) and CTE values of 4–8×10⁻⁶/K, with less than 10% degradation in thermal performance after 500 thermal cycles 1318. The boronization process typically involves heating diamond powder in a boron-containing atmosphere (BCl₃/H₂ or B₂O₃ vapor) at 900–1100°C for 1–4 hours, followed by infiltration with molten Cu or Cu-Ag eutectic at 1050–1150°C under inert atmosphere 13.
Sputter deposition of multi-layer coatings (e.g., Ti/Cu/Ag or Cr/Ni/Cu) on diamond particles prior to compaction and infiltration provides both carbide-forming elements for chemical bonding and brazeable layers for liquid-phase sintering 11. This approach, combined with infiltration using Cu-Ag eutectic braze (72Cu-28Ag, melting point 780°C), produces dense composites (porosity <2%) with thermal conductivities comparable to synthetic diamond films (800–1200 W/(m·K)) at significantly lower cost 11.
Field-assisted sintering technology, also known as spark plasma sintering (SPS), applies pulsed DC current through a graphite die containing diamond-metal powder mixtures, enabling rapid heating rates (50–200°C/min) and short sintering times (5–20 minutes) at temperatures of 700–950°C and pressures of 30–80 MPa 5. FAST processing of diamond-Cu-Cr composites (60 vol% diamond, 38 vol% Cu, 2 vol% Cr) achieves thermal conductivities of 500–1000 W/(m·K) with minimal diamond graphitization due to the short thermal exposure 5. The Cr additive forms interfacial carbides that bond Cu to diamond, while the rapid sintering kinetics suppress grain growth and preserve the fine microstructure. FAST-processed diamond composites are suitable for integrated heat spreaders (IHS) in high-performance CPUs, heat sinks for power electronics, and cold plates for liquid cooling systems 5.
Low-temperature CVD processes (substrate temperature <450°C) enable deposition of high-quality diamond films (sp³ content >90%, thermal conductivity 1000–2000 W/(m·K)) on thermally conductive substrates (Cu, Al, Cu-W, Cu-Mo) without inducing excessive thermal mismatch stress 19. Conventional high-temperature CVD (700–900°C) generates residual compressive stresses exceeding 1 GPa in diamond films on Cu substrates due to CTE mismatch (diamond: 1×10⁻⁶/K; Cu: 17×10⁻⁶/K), leading to film delamination upon cooling 19. Low-temperature plasma-enhanced CVD (PECVD) or hot-filament CVD (HFCVD) at 350–450°C reduces residual stress to <250 MPa, improving adhesion and reliability 19. Intermediate nucleation layers (TiN, ZrN, SiC) deposited at 200–400°C facilitate diamond nucleation under low-temperature conditions and further reduce interfacial stress 19.
The infiltration route involves compacting coated diamond particles into a porous preform (relative density 50–65%), followed by vacuum or pressure-assisted infiltration with molten metal (Cu, Ag, Al, or alloys) at temperatures 50–150°C above the metal melting point 1113. For diamond-Cu composites, infiltration is typically performed at 1100–1150°C under vacuum (<10⁻³ Pa) or inert atmosphere (Ar, N₂) to prevent oxidation 11. Pressure-assisted infiltration (applied gas pressure 0.5–5 MPa or mechanical pressure via HIP) enhances pore filling and reduces residual porosity to <1%, achieving thermal conductivities within 10% of theoretical predictions based on effective medium approximations 13. Post-infiltration HIP treatment (900–1000°C, 100–200 MPa, 1–2 hours) further densifies the composite and homogenizes the microstructure 9.
Emerging additive manufacturing (AM) techniques, including binder jetting, selective laser sintering (SLS), and direct energy deposition (DED), offer potential for fabricating complex-geometry diamond composite heat sinks and heat exchangers 5. Binder jetting of diamond-Cu powder mixtures followed by debinding and infiltration sintering has demonstrated feasibility for producing lattice-structured heat sinks with tailored porosity and thermal conductivity gradients 17. However, challenges remain in controlling diamond particle distribution, minimizing binder-induced contamination, and achieving interfacial bonding comparable to conventional sintering routes.
Thermal conductivity of diamond carbon composites is typically measured using laser flash analysis (LFA) per ASTM E1461, steady-state comparative methods per ASTM E1530, or transient hot-wire techniques. LFA provides thermal diffusivity (α), which is converted to thermal conductivity (κ) via κ = α·ρ·Cₚ, where ρ is density and Cₚ is specific heat capacity 913. Reported thermal conductivities span a wide range depending on diamond content, particle size, and interfacial quality:
Effective medium models (Maxwell-Eucken, Bruggeman, Hashin-Shtrikman bounds) predict composite thermal conductivity based on constituent properties and volume fractions, but often overestimate experimental values by 20–50% due to interfacial thermal resistance (Rᵢₙₜ ~ 10⁻⁸ to 10⁻⁷ m²·K/W for untreated diamond-metal interfaces, reduced to 10⁻⁹ to 10⁻⁸ m²·K/W with carbide interlayers) 39.
CTE of diamond carbon composites is measured via dilatometry (ASTM E228) or thermomechanical analysis (TMA) over the temperature range -50°C to 200°C. The composite CTE (αc) can be approximated by the rule of mixtures: αc = Vd·αd + Vm·αm, where Vd and Vm are volume fractions of diamond and matrix, and αd and αm are their respective CTEs 9. For diamond (αd ≈ 1×10⁻⁶/K) and Cu (αm ≈ 17×10⁻⁶/K), a 60 vol% diamond composite yields αc ≈ 7.4×10⁻⁶/K, closely matching Si (2.6×10⁻⁶/K) and reducing thermal stress in semiconductor packaging 913.
Thermal cycling tests (e.g., -55°C to 150°C, 1000 cycles per JEDEC JESD22-A104) assess long-term reliability. High-quality diamond-metal composites with carbide or boride interlayers exhibit <10% degradation in thermal conductivity after 1000 cycles, whereas composites with poor interfacial bonding show >30% degradation due to microcracking and delamination 1213.
Diamond carbon composites exhibit high hardness (HV 200–800, depending on diamond content) and compressive strength (300–800 MPa), but relatively low tensile strength (100–250 MPa) and fracture toughness (KIC 8–15 MPa·m½) due to the brittle nature of diamond and weak diamond-matrix interfaces 15. SCD composites (diamond in SiC matrix) demonstrate superior hot hardness and thermal stability compared to PCD composites (diamond with Co binder), maintaining mechanical integrity at temperatures exceeding 1000°C 15. Machinability of diamond composites is challenging; electrical discharge machining (EDM) is commonly employed for shaping, while laser cutting and ultrasonic machining are used for precision features 1015.
Diamond carbon composites are extensively used as heat spreaders, heat sinks, and submounts for high-power semiconductor devices, including insulated-gate bipolar transistors (IGBTs), gallium nitride (GaN) high-electron-mobility transistors (HEMTs), and laser diodes 359. For example, diamond-Cu composites with thermal conductivity of 500 W/(m·K) and CTE of 7×10⁻⁶/K are employed as integrated heat spreaders (IHS) in multi-chip modules, reducing junction temperatures by 15–25°C compared to conventional Cu heat spreaders and extending device lifetime by 2–3× under accelerated aging tests 5. Diamond-Ag composites with thermal conductivity exceeding 600 W/(m·K) serve as submounts for GaN-on-SiC RF power amplifiers, enabling power densities above 10 W/mm while maintaining junction temperatures below 150°C 312.
Nanostructured metal-diamond composite TIMs, consisting of diamond nanoparticles (10–100 nm) encapsulated in low-melting-point metal shells (In, Sn, or In-Sn alloys with fusion temperatures 120–180°C), provide high thermal conductivity (>10 W/(m·K)) and low thermal contact resistance (<0.1 cm²·K/W) when applied between heat sources and heat sinks 7. Upon
| Org | Application Scenarios | Product/Project | Technical Outcomes |
|---|---|---|---|
| Intel Corporation | High-performance CPU integrated heat spreaders, heat sinks for power electronics, and cold plates for liquid cooling systems in data centers and computing applications. | DRIVE AGX Integrated Heat Spreader | Field-assisted sintering technology (FAST) creates diamond-Cu-Cr composites with thermal conductivity of 500-1000 W/(m·K), reducing junction temperatures by 15-25°C and extending device lifetime by 2-3× under accelerated aging tests. |
| A.L.M.T. CORP. | Heat dissipation submounts for GaN-on-SiC RF power amplifiers and high-power semiconductor devices in telecommunications and military applications requiring thermal cycling reliability. | Diamond Composite Heat Radiating Member | Carbide layer coating with Group 4 elements (Ti, Zr, Hf) on diamond particles infiltrated with silver alloy achieves oxygen content below 0.1 mass%, thermal conductivity exceeding 400 W/(m·K), and maintains performance through 1000 thermal cycles between -55°C and 150°C. |
| THE REGENTS OF THE UNIVERSITY OF CALIFORNIA | Heat spreaders and heat sinks for high-density integrated circuits, power electronics modules, and thermal management in aerospace systems requiring cost-effective high thermal conductivity solutions. | Diamond-Copper Composite Heat Spreader | Sputter coating diamond powder with carbide-forming elements and brazeable materials, followed by infiltration with Cu-Ag eutectic braze, produces dense composites with thermal conductivity comparable to synthetic diamond films (800-1200 W/(m·K)) at significantly lower cost and porosity below 2%. |
| Lockheed Martin Corporation | Thermal interface materials between heat sources and heat sinks in high-power electronics, military avionics, and space systems requiring low thermal resistance and reliable thermal coupling. | Nanostructured Metal-Diamond Composite TIM | Metal-diamond composite nanoparticles with diamond cores (10-100 nm) in low-melting-point metal shells (In-Sn alloys, fusion temperature 120-180°C) provide thermal conductivity exceeding 10 W/(m·K) and thermal contact resistance below 0.1 cm²·K/W. |
| PLANSEE GMBH | Heat sinks for high-power semiconductor components including IGBTs and laser diodes, aerospace thermal management systems, and applications requiring CTE matching to silicon and GaN devices. | Boronized Diamond-Copper Heat Sink | Boronization of diamond particles creates B₄C and BC₃ interfacial compounds, enabling diamond-Cu composites with 40-90 vol% diamond to achieve thermal conductivity up to 620 W/(m·K), CTE of 4-8×10⁻⁶/K matching silicon substrates, and less than 10% thermal performance degradation after 500 thermal cycles. |