MAY 5, 202660 MINS READ
Photosensitive polyimide sensor material is fundamentally composed of a polyimide backbone or its precursor (polyamic acid) functionalized with photosensitive moieties that enable selective cross-linking or dissolution upon exposure to ultraviolet or visible light. The base resin typically derives from the polycondensation of aromatic tetracarboxylic dianhydrides (such as pyromellitic dianhydride, PMDA, or biphenyltetracarboxylic dianhydride, BPDA) with aromatic diamines (including oxydianiline, ODA, or bis(aminophenoxy)benzene derivatives)19. The choice of dianhydride and diamine monomers critically determines the thermal stability, glass transition temperature (Tg), coefficient of thermal expansion (CTE), and dielectric properties of the final polyimide film.
In positive-tone photosensitive polyimide compositions, the photosensitive component is commonly a naphthoquinonediazide (NQD) compound, which undergoes photochemical decomposition upon UV exposure (typically i-line at 365 nm) to form indene carboxylic acid, rendering the exposed regions soluble in aqueous alkaline developers23. For example, patent 2 describes a positive photosensitive polyimide composition incorporating phenol-based compounds alongside NQD photosensitizers, achieving high sensitivity (exposure doses of 100–300 mJ/cm²) and resolution down to 10 μm line/space patterns. The alkali-soluble polyimide resin in this system contains carboxyl or phenolic hydroxyl groups that enhance developer solubility, with weight-average molecular weights (Mw) ranging from 20,000 to 50,000 Da and polydispersity indices (PDI) below 2.0 to ensure uniform film formation and minimal defects11.
Negative-tone photosensitive polyimide materials rely on photo-induced cross-linking mechanisms. Patent 7 discloses an intrinsic negative photosensitive polyimide incorporating diacetylenic groups as photosensitive sources, which undergo [2+2] cycloaddition upon UV irradiation to form cross-linked networks without requiring external photoinitiators. This approach achieves self-sensitization and reduces the need for additional photosensitive additives. The composition further integrates fluorinated diamines (such as 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane) to lower the dielectric constant to 2.5–2.8 at 1 MHz and reduce water absorption to below 0.5 wt%, critical for high-frequency electronic applications7. The resulting films exhibit tensile moduli of 3.2–4.5 GPa and tensile strengths exceeding 120 MPa after imidization at 300–350°C.
For sensor applications requiring transparency and low-temperature processing, soluble photosensitive polyimides have been developed. Patent 18 describes a transparent, highly heat-resistant polyimide precursor with alicyclic structures in the dianhydride component (e.g., cyclobutanetetracarboxylic dianhydride, CBDA) and siloxane-containing diamines, yielding films with optical transmittance above 85% at 550 nm and glass transition temperatures of 280–320°C18. The incorporation of siloxane segments (–Si–O–Si–) imparts flexibility (elongation at break >50%) and reduces the CTE to 20–40 ppm/°C, matching that of copper substrates and minimizing thermal stress during device fabrication.
Advanced formulations integrate functionalized nanofillers to enhance sensor performance. Patent 12 reports a photosensitive polyimide composite incorporating functionalized graphene quantum dots (GQDs) prepared via citric acid pyrolysis and subsequent amidation with diaminopyridine. The GQDs, with diameters of 3–8 nm and specific surface areas exceeding 200 m²/g, are uniformly dispersed in the polyimide matrix at loadings of 0.5–2.0 wt%, resulting in films with dielectric constants reduced to 2.3–2.6 and enhanced mechanical properties (tensile modulus increased by 15–25%)12. The amidation modification ensures covalent bonding between GQDs and the polyimide chains, preventing aggregation and maintaining optical clarity.
The molecular architecture of photosensitive polyimide sensor materials must balance competing requirements: high photosensitivity demands sufficient photoreactive group content (typically 10–30 wt% of total solids), while maintaining thermal stability and mechanical integrity requires a robust polyimide backbone with imidization degrees above 95% after final curing610. The use of block copolymers with alternating rigid and flexible segments, as described in patent 8, enables fine-tuning of film properties—rigid aromatic blocks provide thermal stability (decomposition onset >450°C by TGA), while flexible aliphatic or ether linkages reduce internal stress and improve adhesion to substrates such as copper, silicon, and glass8.
The photosensitive mechanisms governing pattern formation in photosensitive polyimide sensor materials are fundamentally divided into positive-tone and negative-tone systems, each employing distinct photochemical pathways to achieve selective solubility differentiation upon UV exposure.
In positive-tone systems, the photosensitive additive—most commonly a naphthoquinonediazide (NQD) derivative—acts as a dissolution inhibitor in the unexposed state. Upon exposure to UV light (typically 300–400 nm), the NQD undergoes Wolff rearrangement to form a ketene intermediate, which rapidly reacts with ambient moisture to yield indene carboxylic acid311. This photoproduct is highly soluble in aqueous alkaline developers (e.g., 0.26 N tetramethylammonium hydroxide, TMAH), whereas the unexposed NQD-containing regions remain insoluble due to hydrogen bonding between NQD and the polyimide precursor's carboxyl or hydroxyl groups. Patent 3 reports that optimized positive-tone formulations achieve development rates of 200–400 nm/s in 2.38 wt% TMAH at 23°C, with contrast ratios (γ) exceeding 3.5, enabling sub-15 μm feature resolution3. The sensitivity of positive systems is typically in the range of 100–500 mJ/cm² at 365 nm, depending on NQD loading (15–25 wt% of resin solids) and the presence of sensitizers such as Michler's ketone or thioxanthone derivatives2.
Negative-tone photosensitive polyimides employ cross-linking chemistry to render exposed regions insoluble. Patent 1 describes a composition utilizing a fluorene-based photoacid generator (PAG) that releases strong acids (e.g., trifluoromethanesulfonic acid) upon UV irradiation. The photogenerated acid catalyzes the cross-linking of epoxy-functionalized polyimide precursors or vinyl ether groups present in thermal cross-linking agents, forming a three-dimensional network18. The unexposed regions, lacking cross-links, are removed by organic solvents (e.g., γ-butyrolactone, N-methyl-2-pyrrolidone) or dilute alkaline solutions. Patent 8 reports that negative-tone systems incorporating 5–30 parts by weight of epoxy cross-linkers (such as bisphenol A diglycidyl ether) and 0.5–5 parts of triarylsulfonium hexafluoroantimonate PAG achieve sensitivities of 50–200 mJ/cm² and can pattern features as small as 5 μm with aspect ratios up to 3:18.
An alternative negative-tone approach involves intrinsic photosensitivity, where the polyimide backbone itself contains photoreactive groups. Patent 7 demonstrates the use of diacetylenic groups incorporated into diamine monomers (e.g., 4,4'-diaminodiphenyl diacetylene). Upon UV exposure at 254–365 nm, the diacetylene moieties undergo topochemical [2+2] cycloaddition to form polydiacetylene segments, which are insoluble in developers7. This intrinsic approach eliminates the need for external photoinitiators, reducing outgassing during thermal curing and improving film purity. The resulting films exhibit dielectric constants of 2.5–2.7 at 1 MHz and maintain mechanical integrity (tensile strength >100 MPa) after imidization at 280–320°C, suitable for low-temperature flexible electronics7.
The role of photoinitiators and photoacid generators is critical in controlling the photospeed and resolution of negative-tone systems. Patent 5 employs oxime ester photoinitiators (e.g., 1-[4-(phenylthio)phenyl]-1,2-octanedione 2-(O-benzoyloxime)) at loadings of 1–5 wt%, which generate free radicals upon exposure to initiate the polymerization of acrylate or methacrylate groups grafted onto the polyimide precursor513. The use of oxime esters provides high quantum efficiency (Φ > 0.3) and minimal absorption in the visible range, enabling deep UV (i-line) patterning of thick films (20–50 μm) with uniform cross-sectional profiles. Patent 13 further reports that the addition of silane coupling agents (e.g., 3-glycidoxypropyltrimethoxysilane at 0.5–10 wt%) enhances adhesion to copper and silicon substrates by forming covalent Si–O–Si or Si–O–Cu bonds at the interface, reducing void formation during high-temperature storage tests (150°C for 500 hours)13.
Post-exposure baking (PEB) is a critical step in both positive and negative systems to amplify the photochemical contrast. In positive-tone formulations, PEB at 90–120°C for 60–180 seconds accelerates the hydrolysis of ketene intermediates and promotes the diffusion of photoproducts, sharpening the boundary between exposed and unexposed regions14. In negative-tone systems, PEB facilitates the acid-catalyzed cross-linking reaction, with optimal temperatures of 80–110°C yielding the highest sensitivity and resolution18. Patent 14 demonstrates that PEB at 100°C for 120 seconds reduces the required exposure dose by 30–40% and improves the sidewall angle of patterned features from 75° to 85°, approaching vertical profiles desirable for high-density interconnects14.
The development process must be carefully optimized to achieve high-resolution patterns without residue or undercutting. Positive-tone systems typically use aqueous TMAH solutions at concentrations of 0.26–2.38 wt%, with development times of 30–120 seconds at 23°C23. The addition of surfactants (e.g., polyoxyethylene alkyl ethers at 0.01–0.1 wt%) reduces surface tension and improves wetting, enabling uniform development of high-aspect-ratio features11. Negative-tone systems may employ organic developers (e.g., cyclopentanone, propylene glycol monomethyl ether acetate) or dilute alkaline solutions (0.1–0.5 wt% TMAH), depending on the cross-linking density and the solubility of the uncross-linked resin78. Patent 10 reports that the use of a two-stage development process—initial immersion in a weak developer (0.1 wt% TMAH) followed by a stronger developer (0.5 wt% TMAH)—reduces line edge roughness (LER) to below 50 nm for 10 μm features10.
The synthesis of photosensitive polyimide sensor materials begins with the preparation of polyamic acid (PAA) precursors via the polycondensation of aromatic tetracarboxylic dianhydrides and diamines in polar aprotic solvents such as N-methyl-2-pyrrolidone (NMP), N,N-dimethylacetamide (DMAc), or γ-butyrolactone (GBL)412. The reaction is typically conducted at 0–60°C under inert atmosphere (nitrogen or argon) to prevent oxidative degradation, with monomer addition sequences and stoichiometric ratios carefully controlled to achieve target molecular weights (Mw = 20,000–80,000 Da) and narrow polydispersity (PDI < 2.5)1118.
For positive-tone formulations, the PAA is synthesized with excess diamine to introduce terminal amine groups, which enhance solubility in alkaline developers. Patent 11 describes a synthesis route where 4,4'-oxydianiline (ODA) and 3,3',4,4'-biphenyltetracarboxylic dianhydride (BPDA) are reacted in NMP at 25°C for 6 hours, followed by the addition of 3-aminophenol (5–15 mol% relative to total diamine) to introduce phenolic hydroxyl groups that further increase alkali solubility11. The resulting PAA solution, with a solid content of 15–25 wt% and a viscosity of 2000–8000 cP at 25°C, is then blended with naphthoquinonediazide photosensitizers (20–30 wt% of resin solids) and additives such as phenolic novolac resins (5–15 wt%) to improve film-forming properties and reduce tackiness19.
Negative-tone photosensitive polyimides often incorporate reactive functional groups during PAA synthesis. Patent 5 employs a grafting strategy where allyl glycidyl ether (AGE) is reacted with PAA in the presence of a base catalyst (triethylamine) at 40–60°C, introducing epoxy groups onto the polymer backbone5. The epoxy-functionalized PAA is then mixed with a photoradical initiator (e.g., bis(2,4,6-trimethylbenzoyl)phenylphosphine oxide at 1–3 wt%) and a thermal cross-linking agent (e.g., hexamethylene diisocyanate at 10–20 wt%) to enable dual-cure mechanisms—photoinitiated radical polymerization during exposure and thermal cross-linking during final imidization5. This approach yields films with low repulsive force (<0.5 N at 180° peel test) and high adhesion to copper foils (>1.0 kN/m), critical for flexible printed circuit applications5.
For intrinsic negative-tone systems, diacetylenic diamines are synthesized via Glaser coupling of terminal alkynes. Patent 7 describes the preparation of 4,4'-diaminodiphenyl diacetylene by reacting 4-ethynylaniline with copper(I) chloride and pyridine in methanol at 60°C for 12 hours, yielding a crystalline product with a melting point of 185–190°C7. This diamine is then copolymerized with 2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane (6FDA-diamine) and 4,4'-(hexafluoroisopropylidene)diphthalic anhydride (6FDA) in DMAc at 20°C, producing
| Org | Application Scenarios | Product/Project | Technical Outcomes |
|---|---|---|---|
| LG CHEM LTD. | Organic insulating films and stress buffer layers in semiconductor packaging, flexible printed circuits, and high-density interconnects requiring fine pattern formation and thermal stability. | Photosensitive Polyimide for Display Devices | Fluorene-based photoacid generator enables high-sensitivity patterning (50-200 mJ/cm² exposure dose) with sub-5 μm resolution and aspect ratios up to 3:1, suitable for negative-tone lithography in electronic insulation applications. |
| DONGWOO FINE-CHEM CO. LTD. | Microelectronic device fabrication including semiconductor packaging, flexible circuit boards, and applications requiring high-resolution photolithographic patterning with excellent electrical insulation. | Positive Photosensitive Polyimide Composition | Naphthoquinonediazide photosensitizer achieves high sensitivity (100-300 mJ/cm²) and resolution down to 10 μm line/space patterns with development rates of 200-400 nm/s in TMAH developer, enabling precise positive-tone patterning. |
| MICROCOSM TECHNOLOGY CO. LTD | Protective films and coverlay materials for flexible printed circuit boards (FPC), solder-resistant applications, and low-temperature processable electronic assemblies requiring excellent adhesion and mechanical flexibility. | Low Repulsive Force Polyimide Protective Film | Dual-cure mechanism combining photoradical initiation and thermal cross-linking with isocyanate compounds achieves low repulsive force (<0.5 N at 180° peel test) and high copper adhesion (>1.0 kN/m), suitable for flexible electronics. |
| GUANGDONG UNIVERSITY OF TECHNOLOGY | High-frequency electronic applications including integrated circuit packaging, 5G communication devices, and microelectronic sensors requiring low dielectric loss, minimal water absorption, and high thermal stability. | Low-Dielectric Intrinsic Negative Photosensitive Polyimide | Diacetylenic groups enable self-sensitization via [2+2] cycloaddition without external photoinitiators, achieving dielectric constant of 2.5-2.8 at 1 MHz, water absorption below 0.5 wt%, and tensile strength exceeding 120 MPa after 300-350°C imidization. |
| ASAHI KASEI KABUSHIKI KAISHA | Semiconductor device interlayer insulation, copper wiring protection in advanced packaging, and applications requiring robust adhesion under thermal cycling and high-temperature storage conditions. | High-Adhesion Photosensitive Polyimide for Semiconductor Devices | Oxime ester photoinitiators with silane coupling agents (0.5-10 wt%) prevent void formation at Cu-polyimide interfaces during high-temperature storage tests (150°C for 500 hours), enhancing adhesion and reliability in semiconductor packaging. |