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Zirconium Alloy Sputtering Target Material: Composition, Manufacturing, And Advanced Applications In Thin Film Deposition

MAY 18, 202662 MINS READ

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Zirconium alloy sputtering target material represents a critical component in physical vapor deposition (PVD) processes for advanced thin film applications across semiconductor, optical coating, and magnetic recording industries. These targets typically comprise zirconium combined with elements such as copper, iron, cobalt, titanium, or tantalum to achieve specific microstructural, magnetic, and electrical properties essential for high-performance sputtering operations. The selection of alloying elements and processing parameters directly influences target density, conductivity, magnetic permeability, and ultimately the quality of deposited films.
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Compositional Design And Alloying Strategies For Zirconium Sputtering Target Material

The compositional engineering of zirconium alloy sputtering target material fundamentally determines both the sputtering behavior and the properties of resultant thin films. Contemporary research demonstrates that multi-element zirconium alloys offer superior performance compared to pure zirconium targets through controlled phase formation and microstructural refinement.

Zirconium-Copper-Iron/Nickel/Cobalt Alloy Systems

Advanced zirconium alloy sputtering target material compositions incorporate 58-80 at% Zr with 4-26 at% Cu and 4-26 at% of transition metals (Fe, Ni, or Co) to achieve exceptional thermal and mechanical stability 8,12. This compositional range enables the formation of amorphous thin films with high corrosion resistance and nitride coatings with superior hardness. The Zr-Cu-Fe/Ni/Co system exhibits excellent glass-forming ability, which translates to uniform sputtering rates and consistent film properties across extended deposition runs 8. Specifically, targets containing Zr₅₈Cu₂₆Fe₁₆ (at%) demonstrate optimal balance between mechanical strength (enabling robust target handling) and sputtering efficiency, with measured deposition rates exceeding 15 nm/min at 300W DC power 12.

The selection among Fe, Ni, or Co as the third element allows tailoring of magnetic properties in the deposited films. Iron additions promote soft magnetic characteristics suitable for perpendicular magnetic recording media, while cobalt enhances saturation magnetization 10. Nickel incorporation improves oxidation resistance of both the target and deposited films, extending operational lifetime in reactive sputtering environments 8.

Aluminum-Tellurium-Copper-Zirconium Quaternary Alloys

For specialized optical and phase-change memory applications, Al-Te-Cu-Zr alloy sputtering target material provides unique advantages. Optimal compositions contain 20-40 at% Te, 5-20 at% Cu, 5-15 at% Zr with the balance being aluminum 1,2. The critical innovation in these targets lies in phase control: high-performance targets exhibit a microstructure comprising Al phase, Cu phase, CuTeZr phase, CuTe phase, and Zr phase, while deliberately avoiding free Te phase, Cu phase segregation, and standalone CuTe phase that would cause particle formation during sputtering 1.

Targets with the phase assemblage of Al + Cu + CuTeZr + CuTe + Zr demonstrate superior stability, with particle generation rates below 0.3 particles/cm² during 50 kWh sputtering operations 2. The CuTeZr ternary phase acts as a microstructural stabilizer, preventing compositional drift during extended sputtering and maintaining consistent film stoichiometry. Oxygen content in these targets must be controlled below 500 ppm to prevent oxide inclusion-induced arcing 1.

Cobalt-Zirconium-Tantalum Alloys For Magnetic Applications

CoZrTa(X) sputtering target material, where X represents optional additions of Mo, Pd, Ni, Ti, V, W, or B, addresses the stringent requirements of soft magnetic underlayers in perpendicular magnetic recording media 14. The compositional design targets maximum magnetic permeability (μmax) of 60 or lower to ensure stable sputtering plasma and minimize magnetic field distortion near the target surface 14.

Typical compositions range from Co₇₀₋₈₅Zr₅₋₁₅Ta₅₋₁₅ (at%), with the Zr and Ta content jointly controlled within 10-25 at% to achieve optimal amorphous phase formation in deposited films 14. The pass-through flux (PTF) variation, defined as (FMax−FMin)/FAverage, must be maintained at 0.2 or lower, preferably 0.15 or lower, to ensure uniform erosion and consistent film thickness distribution 14. Targets meeting these specifications enable deposition of soft magnetic films with saturation magnetization (Ms) exceeding 1.8 T and coercivity (Hc) below 1 Oe 10.

Boron-Containing Zirconium Alloys For Enhanced Mechanical Strength

Sputtering target material incorporating 10-50 at% B with zirconium and optional additions of Ti, Hf, V, Nb, Ta, Cr, Mo, W, Mn, Re, Ru, Rh, Ir, Ni, Pd, Pt, Cu, or Ag (0-20 at% combined) addresses the mechanical fragility challenge of conventional zirconium targets 5. The boron addition promotes formation of hard intermetallic phases (ZrB₂, with Vickers hardness ~23 GPa) that significantly enhance target fracture toughness and resistance to thermal shock during high-power sputtering 5.

Critical to performance is maintaining hydrogen content below 20 ppm, as higher hydrogen levels cause embrittlement and premature target cracking 5. These targets exhibit flexural strength exceeding 800 MPa, compared to 400-500 MPa for pure zirconium targets, enabling operation at power densities above 50 W/cm² without mechanical failure 5.

Microstructural Characteristics And Phase Engineering In Zirconium Alloy Sputtering Target Material

The microstructure of zirconium alloy sputtering target material critically governs sputtering uniformity, target lifetime, and film quality. Advanced characterization techniques including X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM) reveal the complex phase assemblages that determine target performance.

Phase Constitution And Crystal Structure Control

High-performance Co-Zr-based alloy targets exhibit a carefully engineered microstructure featuring finely dispersed HCP-Co phase within an FCC-Co dominant alloy matrix 4. The X-ray diffraction pattern must show an intensity ratio IFCC(200)/IHCP(101) ≤ 0.25 to ensure optimal soft magnetic properties in deposited films 4. This phase balance is achieved through controlled sintering at temperatures between 800-1250°C under pressures of 100-1000 MPa, with precise control of heating rate (5-15°C/min) and holding time (2-6 hours) 10.

For Al-Te-Cu-Zr targets, the desired microstructure comprises a continuous Al matrix (grain size 5-20 μm) with uniformly distributed CuTeZr intermetallic particles (1-5 μm diameter) and fine CuTe precipitates (0.2-1 μm) 2. The absence of free Te phase is verified by XRD peak analysis, confirming no characteristic Te peaks at 2θ = 27.5° or 38.2° 1. This phase configuration prevents Te segregation during sputtering, which would otherwise cause severe particle contamination and nodule formation on deposited films 1.

Grain Size And Texture Optimization

Grain size in zirconium alloy sputtering target material significantly affects sputtering rate uniformity and film microstructure. Optimal targets exhibit average grain sizes between 10-50 μm, achieved through controlled powder metallurgy processing 10. Excessively large grains (>100 μm) lead to preferential sputtering along specific crystallographic planes, causing non-uniform erosion profiles and thickness variations in deposited films 4.

Texture control is particularly critical for magnetic alloy targets. Co-Zr-Ta targets require random or weakly textured microstructures to ensure isotropic magnetic properties, with texture coefficients for major crystallographic orientations maintained within ±15% of the random powder diffraction value 14. This is accomplished through multi-step powder mixing protocols combining Fe-rich (Fe/(Fe+Co) ≥ 0.90) and Co-rich (Fe/(Fe+Co) ≤ 0.10) precursor powders, followed by hot isostatic pressing (HIP) consolidation 10.

Density And Porosity Requirements

Relative density represents a critical quality metric for zirconium alloy sputtering target material, with specifications typically requiring ≥95% of theoretical density 19. Residual porosity above 5% causes several detrimental effects: reduced thermal conductivity leading to localized overheating, preferential arcing at pore sites, and particle ejection from sub-surface voids 19. Advanced powder processing techniques, including media-less dry pulverization to achieve powder particle sizes of 0.5-3 μm followed by vacuum hot pressing at 900-1100°C, consistently achieve relative densities exceeding 98% 19.

For oxide-containing targets (e.g., Zr-Ti mixed oxides), density requirements are even more stringent due to the inherently lower conductivity of oxide phases 16. These targets must achieve ≥97% relative density with pore sizes below 5 μm to prevent catastrophic arcing during reactive sputtering 16.

Manufacturing Processes And Production Methods For Zirconium Alloy Sputtering Target Material

The production of high-quality zirconium alloy sputtering target material demands sophisticated metallurgical processing to achieve the required compositional homogeneity, phase constitution, and physical properties. Multiple manufacturing routes are employed depending on target composition and application requirements.

Powder Metallurgy And Sintering Techniques

Powder metallurgy represents the predominant manufacturing approach for complex zirconium alloy sputtering target material. The process begins with high-purity elemental powders (≥99.9% purity for Zr, Cu, Fe, Co, Ni) that undergo controlled mixing in inert atmosphere (Ar or N₂ with O₂ < 10 ppm) to prevent oxidation 8,12. For Al-Te-Cu-Zr targets, pre-alloyed powders are preferred over elemental mixing to ensure homogeneous Te distribution and prevent volatilization during sintering 1.

The mixed powders undergo consolidation via hot pressing, hot isostatic pressing (HIP), or spark plasma sintering (SPS). For Co-Zr-based magnetic alloys, a two-powder mixing strategy proves optimal: combining Fe-rich powder (Fe/(Fe+Co) = 0.90-1.00, containing 3-12 at% of Zr+Hf+Nb+Ta+B/2) with Co-rich powder (Fe/(Fe+Co) = 0.00-0.10, containing 3-12 at% of Zr+Hf+Nb+Ta+B/2) in ratios calculated to achieve final composition of Fe/(Fe+Co) = 0.20-0.65 10. This approach enables superior densification and magnetic property control compared to single-powder processing 10.

Sintering parameters critically influence final target properties. Optimal conditions for Co-Zr-Ta alloys include temperatures of 800-1250°C, pressures of 100-1000 MPa, and holding times of 1-4 hours under vacuum (< 10⁻³ Pa) or inert gas atmosphere 10. For Al-Te-Cu-Zr targets, lower sintering temperatures (450-650°C) are necessary to prevent Te volatilization, requiring longer holding times (4-8 hours) to achieve adequate densification 2.

Electron Beam Melting For High-Purity Zirconium Targets

For applications requiring ultra-high purity zirconium alloy sputtering target material, electron beam (EB) melting provides superior contamination control compared to powder metallurgy 9. The process begins with surface-cleaned Zr or Hf sponge (total metallic impurities < 100 ppm) that undergoes multiple EB melting cycles (typically 3-5 passes) under high vacuum (< 10⁻⁴ Pa) to achieve oxygen contents below 300 ppm and carbon below 50 ppm 9.

EB-melted ingots exhibit columnar grain structures with grain sizes of 100-500 μm, which require subsequent thermomechanical processing (forging at 600-800°C followed by rolling with 30-60% reduction) to refine grain size to the optimal 10-50 μm range 9. For powder production from EB-melted ingots, a hydrogenation-dehydrogenation (HDH) process is employed: the ingot is hydrided at 400-600°C under 0.1-1 MPa H₂ pressure, mechanically crushed, and then dehydrided at 600-800°C under vacuum to yield high-purity zirconium powder suitable for subsequent target fabrication 9.

Reactive Sintering For Oxide-Based Targets

Zirconium oxide-based sputtering target material, including Zr-Ti mixed oxide targets, requires specialized reactive sintering processes 16,17. The manufacturing sequence involves:

  1. Powder preparation: Mixing ZrO₂ powder (monoclinic or tetragonal phase, particle size 0.5-5 μm) with TiO₂ powder (anatase or rutile, particle size 0.3-3 μm) in ratios corresponding to desired Zr:Ti atomic ratios 16

  2. Joint melting under reducing conditions: The mixed oxide powders undergo arc melting or plasma melting at temperatures of 2400-2800°C under controlled reducing atmosphere (Ar + 2-10% H₂) to form mixed oxide phases while maintaining oxygen deficit of 0.40-2.0 wt% compared to fully oxidized stoichiometry 16

  3. Controlled cooling and annealing: The melted material is cooled at rates of 50-200°C/min to promote mixed oxide phase formation, followed by annealing at 1000-1400°C for 4-12 hours to homogenize the microstructure 16

The resulting targets exhibit XRD patterns with characteristic peaks at 2θ = 28.2°±0.2° (Zr-rich phase), 31.4°±0.2° (mixed oxide phase), and 30.2°±0.2° (Ti-rich phase), confirming successful mixed oxide formation 15. This phase constitution eliminates non-conductive ZrO₂ islands that cause arcing in conventional mechanically mixed targets 16.

Quality Control And Characterization Protocols

Comprehensive quality control for zirconium alloy sputtering target material includes:

  • Compositional analysis: Inductively coupled plasma mass spectrometry (ICP-MS) or X-ray fluorescence (XRF) to verify elemental composition within ±0.5 at% of specification 1,2
  • Density measurement: Archimedes method to confirm relative density ≥95% 19
  • Electrical resistivity mapping: Four-point probe measurements across target surface to ensure resistivity uniformity with maximum-to-minimum ratio ≤3 3
  • Magnetic property evaluation: Vibrating sample magnetometry (VSM) to measure saturation magnetization, coercivity, and magnetic permeability 14
  • Microstructural characterization: SEM/EDS analysis to verify phase distribution and grain size, XRD to confirm phase constitution 4,10
  • Impurity analysis: Glow discharge mass spectrometry (GDMS) to quantify trace impurities, with particular attention to O (< 500 ppm), C (< 200 ppm), N (< 100 ppm), and H (< 20 ppm) 5,9

Physical And Chemical Properties Of Zirconium Alloy Sputtering Target Material

The performance of zirconium alloy sputtering target material in PVD processes depends critically on a constellation of physical and chemical properties that must be optimized for specific applications.

Electrical Conductivity And Resistivity Characteristics

Electrical resistivity directly impacts sputtering efficiency and power coupling to the target. Pure zirconium exhibits resistivity of approximately 42 μΩ·cm at room temperature, while alloying significantly modifies this property 9. Zr-Cu-Fe/Ni/Co alloys demonstrate resistivities in the range of 80-150 μΩ·cm depending on composition, with higher transition metal content generally increasing resistivity due to enhanced electron scattering

OrgApplication ScenariosProduct/ProjectTechnical Outcomes
JX NIPPON MINING & METALS CORPORATIONPhase-change memory applications, optical coating deposition, and specialized thin film applications requiring high compositional stability and low contamination.Al-Te-Cu-Zr Alloy Sputtering TargetEliminates Te phase, Cu phase and CuTe phase in target structure, effectively preventing particle formation and nodules during sputtering with oxygen content reduced below 500 ppm, achieving particle generation rates below 0.3 particles/cm² during 50 kWh operations.
HITACHI METALS LTDSoft magnetic film deposition for perpendicular magnetic recording media in hard disk drives and magnetic storage devices.Co-Zr-Based Alloy Sintered Sputtering TargetAchieves IFCC(200)/IHCP(101) intensity ratio of 0.25 or less with finely dispersed HCP-Co phase in FCC-Co matrix, providing superior soft magnetic properties and low magnetic permeability for stable sputtering plasma.
SANYO SPECIAL STEEL CO. LTD.High-power sputtering applications requiring enhanced mechanical strength and thermal shock resistance in semiconductor and hard coating deposition processes.Boron-Containing Zirconium Alloy Sputtering TargetContains 10-50 at% B forming hard ZrB₂ intermetallic phases with Vickers hardness ~23 GPa, achieving flexural strength exceeding 800 MPa and hydrogen content below 20 ppm, enabling operation at power densities above 50 W/cm² without mechanical failure.
Materion Advanced Materials Germany GmbHSoft magnetic underlayers in perpendicular magnetic recording media for high-density data storage applications.CoZrTa(X) Sputtering TargetAchieves maximum magnetic permeability μmax of 60 or lower and PTF variation of 0.2 or lower, enabling deposition of soft magnetic films with saturation magnetization exceeding 1.8 T and coercivity below 1 Oe.
HERAEUS DEUTSCHLAND GMBH & CO. KGOptical coating applications on glass substrates and transparent conductive film deposition requiring high uniformity and defect-free layers.Zr-Ti Mixed Oxide Sputtering TargetContains at least 30 wt% mixed oxide phase with oxygen deficit of 0.40-2.0 wt%, eliminating non-conductive ZrO₂ islands and preventing arcing during sputtering, achieving uniform coating layers with improved conductivity.
Reference
  • SPUTTERING TARGET COMPRISING Al-Te-Cu-Zr ALLOY, AND METHOD FOR PRODUCING SAME
    PatentWO2015146311A1
    View detail
  • SPUTTERRING TARGET COMPRISING Al-Te-Cu-Zr-BASED ALLOY AND METHOD OF MANUFACTURING SAME
    PatentWO2016056612A1
    View detail
  • Sputtering target material and sputtering target
    PatentWO2019176414A1
    View detail
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