Halbleiterbauelement und verfahren zur herstellung davon

AT1853224TInactive Publication Date: 2025-11-15UNITED MICROELECTRONICS CORP
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Patent Information

Application Number
AT2022190014T
Authority / Receiving Office
AT · AT
Patent Type
Patents
Current Assignee / Owner
Priority Date
2022-02-21
Filing Date
2022-08-11
Publication Date
2025-11-15
Estimated Expiration
Not applicable · inactive patent
Patent Text Reader

Abstract

A method for fabricating a semiconductor device includes the steps of: providing a substrate having a high-voltage (HV) region and a low-voltage (LV) region; forming a base on the HV region and fin-shaped structures on the LV region; forming a first insulating around the fin-shaped structures; removing the base, the first insulating layer, and part of the fin-shaped structures to form a first trench in the HV region and a second trench in the LV region; forming a second insulating layer in the first trench and the second trench; and planarizing the second insulating layer to form a first shallow trench isolation (STI) on the HV region and a second STI on the LV region.
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