Halbleiterbauelement und verfahren zur herstellung davon
AT1853224TInactive Publication Date: 2025-11-15UNITED MICROELECTRONICS CORP
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Patent Information
- Application Number
- AT2022190014T
- Authority / Receiving Office
- AT · AT
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2022-02-21
- Filing Date
- 2022-08-11
- Publication Date
- 2025-11-15
- Estimated Expiration
- Not applicable · inactive patent
Abstract
A method for fabricating a semiconductor device includes the steps of: providing a substrate having a high-voltage (HV) region and a low-voltage (LV) region; forming a base on the HV region and fin-shaped structures on the LV region; forming a first insulating around the fin-shaped structures; removing the base, the first insulating layer, and part of the fin-shaped structures to form a first trench in the HV region and a second trench in the LV region; forming a second insulating layer in the first trench and the second trench; and planarizing the second insulating layer to form a first shallow trench isolation (STI) on the HV region and a second STI on the LV region.
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