Unlock instant, AI-driven research and patent intelligence for your innovation.

System for cleaning substrate

一种基板、清洁的技术,应用在系统领域,能够解决清洁室污染严重、清洁室清洁度问题等问题

Inactive Publication Date: 2008-06-11
SK HYNIX INC
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] Moreover, the inside of the housing is not a closed space from the clean room, and therefore, the pollution of the clean room also becomes serious
Specifically, the fumes are diffused into the clean room outside the housing through the holes for putting the substrates into and taking out the substrates from the housing and through the gaps of the substrate inlets inside the housing, and these diffused fumes are harmful to the clean room. cleanliness creates a serious problem

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System for cleaning substrate
  • System for cleaning substrate
  • System for cleaning substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] A system for cleaning a substrate according to a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings.

[0022] Figures 2 and 3A are a configuration view and a perspective view respectively schematically showing a cleaning device according to a preferred embodiment of the present invention.

[0023] Referring to Figures 2 and 3A, the cleaning device according to the present invention includes a plurality of dipping tanks 202A to 202D located at the bottom of the housing 201, and a plurality of mechanical arms 203A to 203E located at the top portion of the housing 201, It is located above a plurality of dip tanks 202A-202D. Substrate inlets enabled with opening and closing motions are formed on the top of each of the dip tanks 202A-202D. Thus, through the substrate inlet, the plurality of robotic arms 203A-203E put the substrates into and take out the substrates from the corresponding dip tanks 202A-202D. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Disclosed is a system for cleaning a substrate such as a semiconductor wafer in wet type to thereby reduce airborne molecular contaminants (AMCs) in a wet station and a cleaning room by efficiently exhausting fumes generated during a wet cleaning process. The system for cleaning the substrate includes: a housing; a plurality of bathes placed inside of the housing; a transferring means placed on a top portion of the plurality of bathes for transferring a substrate; a first exhausting means connected to the plurality of bathes for exhausting fumes inside of the plurality of bathes; and a second exhausting means placed in a space inside of the housing and outside of the plurality of bathes for exhausting chemical fumes.

Description

technical field [0001] The present invention relates to a system for wet cleaning substrates, such as semiconductor wafers; airborne molecular pollutants (airborne molecular contaminant, AMC). Background technique [0002] As is well known, after performing a series of steps such as depositing a thin layer, etching, polishing and implanting ions, the substrate should be subjected to a wet cleaning process to continue the subsequent process. The wet station contains multiple dip tanks, which have different chemistries; and thus, the substrate is sequentially transferred to each dip tank placed close to each other. [0003] Figure 1 is a diagram conceptually illustrating a conventional chemical mechanical polishing (CMP) wet station. [0004] As shown, a plurality of dipping tanks 102A, 102B, 102C and 102D are placed at the bottom portion of the housing 101 . For the substrate transfer device, a plurality of robot arms 103A, 103B, 103C, 103D and 103E are placed in the top p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): B08B3/04B08B7/04H01L21/306B08B3/00B08B15/02
CPCB08B2215/003B08B15/02B08B3/04E02B7/36E02B7/28
Inventor 朴炫烈裵钟坤
Owner SK HYNIX INC