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Synchronous radiation single-colour device crystal thermal-dilation deformation detecting method

A detection method and monochromator technology, applied in instruments, measuring devices, etc., can solve problems such as crystal reflection efficiency and angle change of reflected light

Inactive Publication Date: 2008-09-03
INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
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  • Application Information

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Problems solved by technology

However, the deformation on the order of microns is 10 -10 Meter( ) level of X-rays, it may cause non-negligible changes in crystal reflection efficiency and reflected light angle

Method used

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  • Synchronous radiation single-colour device crystal thermal-dilation deformation detecting method
  • Synchronous radiation single-colour device crystal thermal-dilation deformation detecting method
  • Synchronous radiation single-colour device crystal thermal-dilation deformation detecting method

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Embodiment Construction

[0054] figure 1 It is a schematic diagram of the effect of the thermal deformation of the monochromator crystal on the reflected output monochromatic light. The synchrotron radiation power incident on the monochromator crystal will inevitably cause thermal expansion of the monochromator crystal, and the thermal expansion and deformation of the crystal will affect the uniformity and quality of the reflected output monochromatic light.

[0055] figure 2 It is a schematic diagram of the relationship between the surface slope of the crystal surface after thermal expansion and deformation and the resulting X-ray deflection angle. Taking a specific point M on the crystal surface as the research object, assuming that the deformation slope of point M caused by thermal deformation is Δθ, such as figure 2 shown. Depend on figure 2 It can be seen that according to the Bragg diffraction geometry, the deviation angle of the diffracted light at point M will be 2Δθ, which is equivalen...

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Abstract

The invention relates to high sensitive testing technology-- synchrotron radiation momochromator crystal thermal expansion deformation testing method. It transforms crystal reflecting efficiency and reflecting light deflection angle as detecting signal according to heating deformation of momochromator. Using information separating technology, the reflecting efficiency and reflecting light deflection angle alteration would be measured. The momochromator crystal thermal expansion deformation would be calculated according to the tested data.

Description

technical field [0001] The invention relates to the technical field of high-sensitivity detection of tiny deformations, in particular to a detection method for crystal thermal expansion of a synchrotron radiation monochromator. Background technique [0002] The crystal monochromator is a key component in the hard X-ray monochromatic beamline of synchrotron radiation, and its main function is to realize the monochromation of the X-ray energy of synchrotron radiation through precise adjustment. When the "white light" X-ray of synchrotron radiation is incident on the monochromator crystal at an angle of θ, according to the Bragg (Bragg) equation 2dsinθ=nλ(n=1, 2, 3...) is the diffraction order, d is the lattice spacing), the monochromator crystal will emit monochromatic X-rays with a certain energy. [0003] Synchrotron radiation is the electromagnetic radiation along the tangential direction of the electron track when the electrons moving at high speed in the storage ring pas...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B21/32
Inventor 袁清习黄万霞朱佩平王寯越舒航吴自玉
Owner INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI