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Cylindrical high Q resonant cavity for microwave test under high temperature

A microwave test, cylindrical technology, applied in the direction of resonators, measuring electronics, measuring devices, etc., can solve the problems of complex test devices, difficulty in adapting to the current test requirements, and low measurement accuracy

Inactive Publication Date: 2009-12-09
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

These test devices are complex and have low measurement accuracy, and it is difficult to adapt to the higher temperature test status of low-loss material complex dielectric constant.

Method used

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  • Cylindrical high Q resonant cavity for microwave test under high temperature
  • Cylindrical high Q resonant cavity for microwave test under high temperature
  • Cylindrical high Q resonant cavity for microwave test under high temperature

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Embodiment Construction

[0023] A cylindrical high-Q resonator for microwave testing at high temperatures, such as figure 2 As shown, the upper end including the cylindrical cavity barrel 1 and the upper end is connected by connecting bolts 5 . Wherein the cylindrical cavity 1 is composed of the outer layer 11 of the cavity and the inner layer 12 of the cavity, the upper end cover 2 is composed of the outer layer 21 of the upper end cover and the inner layer 22 of the upper end cover, and the lower end cover 3 is composed of the outer layer 31 of the lower end cover and the inner layer of the lower end cover. The connecting waveguide 4 is composed of a high temperature waveguide 41 , a heat insulating waveguide 42 and a cooling waveguide 43 connected in sequence. The outer layer 11 of the cavity, the outer layer 21 of the upper end cover and the outer layer 31 of the lower end cover are made of a thick layer of high temperature resistant support material, and the inner layer 12 of the cavity, the inn...

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Abstract

The utility model relates to a cylindrical high-Q resonant cavity for high-temperature microwave testing, which belongs to the technical field of microwave testing. The cylindrical high-Q resonant cavity includes a cylindrical cavity, an upper end cover, a lower end cover and a connecting waveguide. The cylindrical cavity, upper end cover and lower end cover are divided into inner and outer layers. It is a thick layer of high temperature resistant support material. Its essence is to use a thin layer of high-temperature noble metal material to make the cavity of a cylindrical high-Q resonant cavity, and use a high-temperature material to support a thin layer of high-temperature noble metal material to form a cylindrical high-Q resonant cavity. The entire cylindrical high-Q resonant cavity is suitable for testing the high-temperature performance of microwave and millimeter-wave dielectric materials, and has the characteristics of simple structure, low cost and long service life.

Description

technical field [0001] A cylindrical high-Q resonant cavity used for microwave testing at high temperature belongs to the technical field of microwave testing, and in particular relates to the complex dielectric constant testing technology of microwave dielectrics. Background technique [0002] Microwave dielectric materials are widely used in microwave devices and microwave systems. During the development and use of these microwave dielectric materials, it is necessary to accurately measure their electrical parameters, namely complex permittivity. [0003] When the microwave dielectric is a low-loss material, the commonly used method is the resonant cavity method. The resonant cavity used may be a stripline resonator, a cylindrical resonant cavity, a rectangular resonant cavity, a quasi-optical cavity, a helical resonant cavity, and the like. For the test of the complex permittivity that requires the polarization direction of the electric field to be parallel to the surfac...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26G01R31/00H01P7/00
Inventor 李恩李仲平聂在平郭高凤张大海何凤梅王金明张其劭
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA