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Memory array circuit

A memory array and circuit technology, applied in static memory, read-only memory, digital memory information, etc., can solve problems such as inability to store components, achieve high-speed reading work, and reduce parasitic capacitance.

Inactive Publication Date: 2010-01-27
LAPIS SEMICON CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0028] However, the above-mentioned memory array circuit completely distinguishes the selection line SL connected to the drain electrode of the memory cell MC and the sub bit line SBL connected to the source electrode, and cannot be applied to a memory element corresponding to 2 bits.

Method used

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] figure 1 is a configuration diagram showing a memory array circuit according to Embodiment 1 of the present invention.

[0043] This memory array circuit has a plurality of subblocks (SUBBLK) 20 (only one of which is shown in the figure) and one multiplexer (MPX) 30 . Each sub-block 20 has a plurality of word lines WLi (i=0, 1, . . . ) arranged in parallel and a plurality of sub bit lines SBLj (j=0, 1, .. .).

[0044] Memory cells MCj (j=0, 1, . . . ) are provided at intersections of word line WLi and sub bit line SBLj (only memory cells corresponding to word line WL0 are shown in the figure). like Figure 4 As shown, each memory cell MCj is a nonvolatile memory element corresponding to 2 bits as follows: memory function bodies are respectively formed on the left and right sidewalls of the gate electrode (control electrode), and memory function bodies are formed corresponding to the two memory function bodies. The left and right diffusion regions are made into the ...

Embodiment 2

[0060] Figure 7 It is a configuration diagram showing a memory array circuit according to Embodiment 2 of the present invention.

[0061] and figure 1 Similarly, the memory array circuit has a plurality of sub-blocks 20A and one multiplexer 30 . Each sub-block 20A has a plurality of word lines WLi (i=0, 1, . . . ) arranged in parallel and a plurality of sub bit lines SBLj (j=0, 1, .. .). Furthermore, at each intersection of the word line WLi and the sub bit line SBLj, a figure 1 For the same memory cell MCj, the gate electrode of the memory cell MCj is connected to the bit line WLi. The first and second electrodes of memory cell MCj are connected to sub bit lines SBLj and SBLj+1, respectively. Furthermore, one end of sub bit line SBLj is connected to common power supply line CDV via drain selector DSj. previous structure and figure 1 The memory array circuit is the same.

[0062] On the other hand, the gates of the 6nth (where n=0, 1, 2, . . . ) drain selectors amo...

Embodiment 3

[0072] Figure 8 is a configuration diagram showing a memory array circuit according to Embodiment 3 of the present invention.

[0073] and figure 1 Similarly, the memory array circuit has a plurality of sub-blocks 20B and one multiplexer 30 . Each sub-block 20B has a plurality of word lines WLi (i=0, 1, . j = 0, 1, . . . ). Furthermore, at each intersection of the word line WLi and the sub bit line SBLj, a figure 1 For the same memory cell MCj, the gate of the memory cell MCj is connected to the word line WLi. The first and second electrodes of memory cell MCj are connected to sub bit lines SBLj and SBLj+1, respectively. One end of sub bit line SBLj is connected to common power supply line CDV via drain selector DSj. previous structure with figure 1 The memory array circuit is the same.

[0074] On the other hand, the gates of the 8nth (where n=0, 1, 2, . . . ) drain selectors among the drain selectors DSj are commonly connected to the drain select line DSA. Simil...

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Abstract

The invention discloses a memory array circuit with high-speed reading work, which is characterized by the following: connecting one end of second bit line (SBL) on the common power source through drain selector (DS) and the other end on the main bit line (MBL) through source selector (SS); switching the selected signal of drain selected line (DSA) of drain selector (DS) and source selected wire (SSE) of source selector (SS); switching secondary bit line (SBL) into drain line or source line of memory unit (MC); making content of memory unit (MC) reach 2 bit; selecting 2 reserving units (MC) with secondary bit line (SBL) of main bit line (MBL) from reserving unit.

Description

technical field [0001] The present invention relates to a memory array circuit for a nonvolatile memory device that stores 2-bit data in one memory cell. Background technique [0002] [Patent Document 1] Japanese Unexamined Patent Publication No. 11-203880 [0003] [Patent Document 2] JP-A-2000-57794 [0004] [Patent Document 3] JP-A-2004-335797 [0005] figure 2 It is a configuration diagram of a conventional memory array circuit described in Patent Document 1 above. [0006] This memory array circuit has a plurality of sub-blocks (SUBBLK) 1 (only one is shown in the figure) and a multiplexer (MPX) 2 . The sub-block 1 has a plurality of word lines WL0, WL1, . . . arranged in parallel and a plurality of selection lines SL0, SL1, . A plurality of sub bit lines SBL0, SBL1, . . . are configured. [0007] Memory cells MC0 , MC1 , . Each memory cell MC stores data depending on the presence or absence of charges accumulated on the floating gate, the control electrode is con...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C11/408G11C11/415G11C11/4195G11C16/08G11C17/18
CPCG11C7/18G11C16/24G11C7/02G11C16/0491G11C2207/002G11C16/04
Inventor 村田伸一
Owner LAPIS SEMICON CO LTD