Random storage failure detecting and processing method, device and system
A random memory and processing method technology, applied in the detection field, can solve problems such as large business impact, inability to achieve complete and accurate detection, and inability to recover in real time, so as to achieve the effect of reducing labor costs
Active Publication Date: 2010-08-04
HUAWEI TECH CO LTD
View PDF0 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0010] First, from the detection mechanism, the existing technology uses the CPU / DSP's own program to detect the RAM program content of the CPU / DSP, and uses an even parity method, which has the risk of not being able to achieve complete and accurate detection
[0011] Second, the processing after the failure still depends on the manual method. Relatively speaking, the workload of manual maintenance is relatively large, and at the same time, it cannot be restored in real time, which has a great impact on the business
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0025] For actual products, CPU / DSP can be divided into two application types according to the characteristics of whether its storage space can be accessed by high-level: one type of CPU / DSP storage space can be controlled by high-level entities (for example, high-level CPU or DSP can be used) DSP as a control entity) access, for the convenience of description, it is referred to as class A for short; the storage space of another type of CPU / DSP cannot be accessed by high-level control entities, it is referred to as class B for short. The technical solution provided by the embodiment of the present invention is mainly aimed at the storage space RAM of a class A CPU / DSP. In addition, the RAM space of the CPU / DSP is divided into two parts: program content and data content. Usually, the program content of the CPU / DSP RAM is fixed, while the data content of the CPU / DSP RAM will continue to change as the data is processed. . In the detection process of RAM failure, its object is th...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses method, a device and a system for detecting and treating RAM invalidation, which is applicable to the detection and treatment of RAM invalidation of CPU / DSP; wherein, the method includes obtaining RAM program content and comparing the obtained program content with accurate program content; conducting data repair of the error program content by using the accurate program content if the error rate of the RAM program content is lower than the preset value; evaluating whether the data repair is successful or not through detecting CPU / DSP data treatment after the data repair; reloading and repairing the RAM program content by a resetting way if the data repair fails according to the evaluation result. The technical proposal provided by the invention can timely and accurately conduct the automatic repair based on RAM invalidation, reduce the impact of RAM invalidation on business and decrease the labor cost.
Description
technical field [0001] The invention relates to the field of detection, in particular to a method, device and system for detecting and processing the failure of a CPU / DSP RAM storage space. Background technique [0002] Devices with random access memory (RAM) will fail due to various reasons during their life cycle. Generally speaking, if the hardware itself is damaged, we call it a device hard failure (Firm Error), otherwise, it is called soft failure of the device (Soft Error). [0003] Soft failure is mainly caused by the impact of charged particles on the memory unit RAM of the device. These high-energy particles interact with the atoms of the semiconductor memory to generate electron-hole pairs, which lead to changes in the information stored in the memory unit, which in turn leads to device function mistake. [0004] At the end of the 1970s, engineers discovered the phenomenon of soft failure. The reason at that time was that the radioactive impurities in the device ...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/28G11C29/44
Inventor 方向
Owner HUAWEI TECH CO LTD