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Testing device

A technology for testing devices and holding tanks, which is applied in the direction of measuring devices, testing of machines/structural components, testing material strength by applying repetitive force/pulsation force, etc., and can solve the problems of inability to guarantee the ejector pin 920, inaccurate pressing force, and pressing stroke Instability and other issues

Active Publication Date: 2008-10-01
AU OPTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] First, the pressing stroke is unstable: in each test process of the traditional test device 900, due to too many variables of the slider 910 and the spring 930, it is impossible to ensure that the thimble 920 presses the button 800, and the button 800 moves for a fixed time. The pressing stroke of D920
[0008] Second, the pressing force is inaccurate: during the test, factors such as the thrust F910 and the spring 930 may also cause the pressing force F920 to not meet the original set value

Method used

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no. 1 example

[0056] Please refer to FIG. 2 and FIG. 3A , FIG. 2 shows a schematic view of the appearance of the test device 100 according to a preferred embodiment of the present invention, and FIG. 3A shows a cross-sectional view of the test device 100 according to FIG. 2 . As shown in FIG. 2 , the test device 100 is used to test the reliability or lifespan of at least one button 700 . The testing device 100 includes at least one pressing mechanism 110 and at least one pressing mechanism 120 . As shown in FIG. 3A , the pressing mechanism 110 includes a first pusher 111 , a second pusher 112 , a first elastic body 113 and an adjustment element 114 . The first elastic body 113 is disposed between the first pusher 111 and the second pusher 112 , and the first elastic body 113 in this embodiment is described by taking a spring as an example. The pressing mechanism 120 includes a striker 121 disposed between the pressing mechanism 110 and the button 700 .

[0057] Wherein, the testing device...

no. 2 example

[0073] The difference between the test device 200 of this embodiment and the test device 100 of the first embodiment lies in the number of the pressing mechanism 110 and the pressing mechanism 120 , and the rest of the similarities will not be repeated here. Please refer to FIG. 5 , which shows a schematic diagram of a test device 200 according to this embodiment. In this embodiment, the testing device 200 includes several pressing mechanisms 110 and several pressing mechanisms 120 . Each pressing mechanism 110 and each pressing mechanism 120 correspond to each other, so as to respectively test the reliability or lifespan of several keys 600 . The pressing mechanisms 110 and the pressing mechanisms 120 are arranged in-line.

[0074] As long as the lengths of the striker 121 of each pressing mechanism 120 are equal, each striker 121 is restricted by the fixing member 122 , so that each striker 121 moves within the same pressing stroke D121 . Therefore, the test performed by e...

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Abstract

The invention discloses a test device. The test device is used for testing the reliability or service life of at least one pressing key. The test device comprises at least one pressure-applying mechanism and at least one pressing mechanism. The pressure-applying mechanism comprises a first pushing piece, a second pushing piece, a first elastomer, a first adjusting component. The first elastomer is arranged between the first pushing piece and the second pushing piece; the first pushing piece and the second pushing piece mutually move in a squeezing distance to squeeze the first elastomer and generate a pressing force. The adjusting component is used for micro-adjusting the squeezing distance. The pressing mechanism comprises a firing pin. The firing pin is arranged between the pressure-applying mechanism and the pressing key. The pressing force pushes the firing pin move toward the pressing key in a pressing travel route.

Description

technical field [0001] The invention relates to a test device, in particular to a test device for testing the reliability and life of keys. Background technique [0002] With the advancement of science and technology, various electronic products are constantly being introduced. Before each new product is launched, a series of reliability tests and life tests are required to ensure the quality of the product. Among them, the buttons of the electronic product are used to perform various electrical functions after the user presses them. Therefore, in the reliability test of the button, repeated pressing must be performed to predict whether the button will maintain a certain quality after a long time of use. [0003] Please refer to FIG. 1A-FIG. 1C , which illustrate a schematic diagram of the operation of a traditional testing device 900 . The traditional testing device 900 includes a slider 910 , a thimble 920 and a spring 930 . The spring 930 is disposed between the thimb...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M19/00G01N3/32G01M99/00
Inventor 赖裕仁
Owner AU OPTRONICS CORP