Chopped wave test circuit and method for semiconductor power device
A power device and test circuit technology, which is applied in the field of semiconductor power device chopping test circuit, can solve the problems of power device loss, failure of freewheeling diode recovery voltage test, insufficient and other problems, and achieve the effect of reducing impact
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[0060] In order to make the above objectives, features and advantages of the present invention more obvious and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0061] See Figure 4 , Is a schematic diagram of a chopper test circuit for a semiconductor power device provided by the first embodiment of the present invention.
[0062] In this test circuit, it includes power supply E, supporting capacitor C1, semiconductor power devices IPM1 and IPM2, inductor L, pulse signal generator, drive protection unit and test leads. Among them, the positive pole of power supply E is connected to the positive pole of capacitor C1 and the positive pole of IPM1. Collector, the emitter of IPM1 is connected to the collector of IPM2, the emitter of IPM2 and the negative electrode of capacitor C1 are connected to the negative electrode of power supply E, and the pulse signal generator is connected t...
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