Object inspecting system
A technology for inspection systems and items, applied in the field of CT imaging devices and DR imaging devices, can solve the problems of reducing the technical performance of explosives inspection systems and image deformation
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[0023] The technical solutions of the present invention will be further specifically described below through the embodiments and in conjunction with the accompanying drawings. In the specification, the same or similar reference numerals designate the same or similar components. The following description of the embodiments of the present invention with reference to the accompanying drawings is intended to explain the general inventive concept of the present invention, but should not be construed as a limitation of the present invention.
[0024] As mentioned above, the image formed by scanning the same item in the trigger mode with equal time intervals at different speeds will be deformed (such as figure 2 shown). Therefore, it is still difficult to solve the problem of image distortion when DR and CT scanning are performed simultaneously on an item in the prior art.
[0025] Considering the above problems, the present invention proposes an item inspection system 100, which m...
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