Power supply test system for CPU (Central Processing Unit)

Abstract

The invention provides a power supply test system for a CPU (Central Processing Unit), which is used in a CPU test. The power supply test system comprises a signal conversion module and a connecting module, wherein, the signal conversion module is electrically connected with the CPU and is used for respectively converting multi-channel power supply voltage values on the CPU into a plurality of digital signals and outputting the plurality of the digital signals and a clock signal, and the signal conversion module comprises a power supply end, a plurality of input terminals, a clock output terminal and a signal output terminal, wherein, the power supply end is used for providing the working voltage of the signal conversion module, each input terminal is electrically connected with single-channel power supply voltage of the CPU, the clock output terminal is used for outputting a clock signal, and the signal output terminal is used for serially outputting the plurality of the digital signals corresponding to the multi-channel power supply voltage of the CPU; and the connecting module is electrically connected with the signal conversion module and is used for serially outputting the plurality of the digital signals corresponding to the multi-channel power supply voltage of the CPU according to the clock signal. By adopting the power supply test system for the CPU provided by the invention, the voltage status of the CPU can be tested immediately so as to prevent the CPU from being burned during test.

Description

technical field [0001] The invention relates to a central processing unit (CPU) testing system, and in particular to a central processing unit power supply testing system. Background technique [0002] At present, with the rapid development of computer hardware integration technology, the functions of the core components of the computer, such as the main board and the central processing unit (Central Processing Unit; CPU), are becoming more and more sophisticated, and the main board and the CPU should go through corresponding testing procedures before leaving the factory. , to test whether its quality is intact. [0003] The traditional motherboard and CPU test method is to put the CPU into the motherboard, and then put it into the test station for power-on testing, so as to directly test the operating status of the CPU. In the test station, when powering on the motherboard and CPU, there will be some differences from the actual working conditions of the CPU. That is to sa...

AI Technical Summary

Problems solved by technology

In the test station, when the motherboard and CPU are powered on, there will be some differences from the actual working conditions of the CPU.

That is to say, when the CPU is put into the motherboard for testing, there will be some abnormal situations, such as the abnormal increase of the power supply, the short circuit of the test circuit, etc., which will cause the CPU to burn out.

However, the manufacturing cost of the CPU is high, and the CPU is burned due to the abnormal situation in the test, causing many unnecessary losses

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