Unlock instant, AI-driven research and patent intelligence for your innovation.

Amorphous indium zinc oxide/carbon nanotube composite film transistor and preparation method thereof

A composite thin film and carbon nanotube technology, which is applied in transistors, semiconductor/solid-state device manufacturing, semiconductor devices, etc., can solve the problems of flexibility gap, large off-state current of TFT, and difficulty in large-area preparation of high-mobility polysilicon materials. Achieve the effect of low cost, high mobility and excellent mechanical stability

Inactive Publication Date: 2013-06-19
WUHAN UNIV
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, currently p -Si-based TFT has two problems: one is that the off-state current of TFT is relatively large; the other is that it is difficult to prepare high-mobility polysilicon materials in a large area at low temperature
[0007] However, it takes a process from the birth of any new technology to its real practical application, and amorphous oxides still face some problems, such as carrier mobility is generally 2 / Vs, there is still a lot of room for improvement, and its flexibility has some gaps compared with organic TFT

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Amorphous indium zinc oxide/carbon nanotube composite film transistor and preparation method thereof
  • Amorphous indium zinc oxide/carbon nanotube composite film transistor and preparation method thereof
  • Amorphous indium zinc oxide/carbon nanotube composite film transistor and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0027] (1) Dissolve 0.285 g of indium nitrate tetrahydrate and 0.165 g of zinc acetate dihydrate in 50 mL of ethylene glycol methyl ether, and add 0.46 mL of ethanolamine as a stabilizer, stir for 2 h, and have a thickness of 300 nm for pre-grown SiO 2 The highly doped Si sheet of the insulating layer was ultrasonically cleaned, and then spin-coated with a spin coater at a speed of 2400 rpm, and then baked at 200 °C for 10 min in the atmosphere, and then spin-coated on the basis of the previous layer. layer to obtain a composite film with a thickness of 60 nm, and finally thermally annealed at 400 °C for 40 min in the atmosphere to obtain a composite film material; (2) using ultraviolet lithography technology, through the first mask, using wet etching (10 wt% dilute hydrochloric acid) for 2 min, the film was divided into small pieces with an area size of 1 mm × 1 mm to reduce the parasitic capacitance and leakage current introduced during the transistor fabrication process. T...

Embodiment 2

[0029] (1) Dissolve 9 mg of carbon nanotubes (CNTs) in 100 mL of ethylene glycol methyl ether by sonication, and suspend them evenly for 4 h to serve as mother liquor for later use. Then 0.285 g of indium nitrate tetrahydrate and 0.165 g of zinc acetate dihydrate were dissolved in 50 mL of ethylene glycol methyl ether, and 0.46 mL of ethanolamine was added as a stabilizer, stirred for 2 h, and 50 mL of carbon nanotube mother liquor was added and ultrasonicated Disperse for 30 min, and then spin-coat at 2400 rpm on pre-grown SiO with a thickness of 300 nm 2 On the insulating layer, after baking at 200 °C for 10 min in the atmosphere, spin-coat another layer on the basis of the previous layer to obtain a composite film with a thickness of 60 nm, and finally thermally anneal at 400 °C for 40 min in the atmosphere to obtain IZO / CNT composite film material; (2) Using ultraviolet lithography technology, through the first mask, using wet etching (10 wt% dilute hydrochloric acid as e...

Embodiment 3

[0033] (1) Dissolve 9 mg of carbon nanotubes (CNTs) in 100 mL of ethylene glycol methyl ether by sonication, and suspend them evenly for 4 h to serve as mother liquor for later use. Then 0.285 g of indium nitrate tetrahydrate and 0.165 g of zinc acetate dihydrate were dissolved in 50 mL of ethylene glycol methyl ether, and 0.46 mL of ethanolamine was added as a stabilizer, stirred for 2 h, 50 mL of carbon nanotube mother liquor was added and Ultrasonic dispersion was performed for 30 min, and then spin-coated on pre-grown SiO with a thickness of 300 nm at a speed of 2400 rpm. 2 On the insulating layer, after baking at 200 °C for 10 min in the atmosphere, spin-coat another layer on the basis of the previous layer to obtain a composite film with a thickness of 60 nm, and finally thermally anneal at 300 °C for 40 min in the atmosphere to obtain IZO / CNT composite film material; (2) Using ultraviolet lithography technology, through the first mask, using wet etching (10 wt% dilute ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
transmittivityaaaaaaaaaa
rate of changeaaaaaaaaaa
Login to View More

Abstract

The invention provides an amorphous indium zinc oxide / carbon nanotube composite film transistor. A flexible indium zinc oxide / carbon nanotube composite film is taken as a semiconductor channel layer. In the composite film, a mass ratio of the carbon nanotube to the indium zinc oxide is between 0.027% and 2.74%. The carbon nanotube is added into an indium salt-zinc salt composite colloid solution so as to prepare a carbon nanotube / indium salt-zinc salt composite colloid solution. A spin coating technology is used to prepare the indium zinc oxide / carbon nanotube composite film with high performance. And then through subsequent thermal annealing, photoetching, etching, photoetching, evaporation and stripping of an electrode, an indium zinc oxide / carbon nanotube composite film field effect transistor with high mobility can be prepared. Through optimizing some technologies, the indium zinc oxide / carbon nanotube with the high field effect and the mobility can be successfully prepared and the indium zinc oxide / carbon nanotube possesses a high mechanical property. Experimental costs are low. A requirement to an experiment condition is low. Repeatability of an experiment result is high. Large-scale batch production can be realized.

Description

technical field [0001] The invention relates to an amorphous indium zinc oxide / carbon nanotube composite thin film transistor and a preparation method thereof, belonging to the field of nanometer materials and nanometer devices. Background technique [0002] With the advent of the information age, display devices (LCD) and electronic paper are accelerating towards flat panelization and energy saving. Among them, active array drive display devices with thin-film transistors (TFT) as switching elements have become one of the most popular flat panel display technologies. of the best. TFT is a field-effect semiconductor device, including several important components such as substrate, semiconductor channel layer, insulating layer, gate and source-drain electrodes, among which the semiconductor channel layer is crucial to device performance. [0003] At present, for TFT-LCD, the semiconductor channel layer mainly adopts amorphous silicon ( a -Si) and polysilicon thin film trans...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/24H01L29/10H01L29/786H01L21/336
Inventor 廖蕾刘曰利刘兴强陈文贺彪
Owner WUHAN UNIV