Test method and test system for polarization of semiconductor laser
A test method and test system technology, applied in the direction of testing optical performance, etc., can solve the problems of rough test polarization degree, inability to judge polarization mode, etc., and achieve the effect of simple adjustment and simple operation.
Active Publication Date: 2013-11-20
FOCUSLIGHT TECH
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[0006] "Experimental Research on the Polarization Characteristics of Semiconductor Laser Array and Its Relationship with Stress" (Vol.36, No.5, May, 2009) in "China Laser" introduced a test method for the polarization characteristics of semiconductor laser arrays, which is a laser beam or The fluorescence beam under the threshold passes through the polarizer and shines on the CCD camera, then rotates the polarizer 90°, records the result, and obtains the value of the degree of polarization. This method can only roughly test the degree of polarization, and cannot judge the polarization mode.
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[0027] Such as figure 1 As shown, 1 is a semiconductor laser; 2 is a beam splitter; 3 is a polarization device; 4 is a converging lens; 5 is a first photodetector; 6 is a first digital multimeter; 7 is a beam splitting prism; 8 is a second photodetector 9 is the second data acquisition card; 10 is the third photodetector; 11 is the third data acquisition card; 12 is the first power detection device; 13 is the second power detection device; 14 is the third power detection device.
[0028] The semiconductor laser 1 emits a laser beam. After the laser beam reaches the beam splitter 2, 95% of the laser beam passes through the beam splitter 2 and reaches the polarization device 3. 5% of the laser beam is reflected by the beam splitter 2 and reaches the beam splitter 7. The beam splitter prism 7 transmits the laser beam whose polarization state is TE, and the dichroic prism 7 reflects the laser beam whose polarization state is TM. The laser beam whose polarization state is TE reach...
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The invention provides a test method and a test system for polarization of a semiconductor laser. The test method and the test system are used for accurately testing a polarizing degree of the semiconductor laser and judging a polarizing mode. In the test system provided by the invention, a light splitter which splits light according to power is arranged at an emitting end of the semiconductor laser; a polarizing component with an adjustable polarizing filtering state, a convergent lens / lens set and a first power detecting device are arranged along a transmission direction of the light splitter in turn; a light splitting prism which splits light according to the polarizing mode is arranged along a reflecting direction of the light splitter; and a second power detecting device and a third power detecting device are respectively arranged on a transmitted light path and a reflected light path diverged from the light splitting prism. The test method and the test system are simple in operation and are suitable for the test of mass semiconductor laser products. When the polarizing degrees of the lasers in different sizes are measured, the test system can be conveniently adjusted. The polarizing mode of the semiconductor laser can be quickly judged.
Description
technical field [0001] The invention relates to a semiconductor laser polarization test method and a test system thereof. Background technique [0002] Due to its small size, high efficiency, long life, high power and many other advantages, high-power semiconductor lasers are widely used in many fields such as medical treatment and industrial processing. Packaging quality is an important factor affecting the quality of semiconductor lasers. [0003] As an important process for laser manufacturing, chip packaging technology is an important limiting factor for the application of high-power semiconductor lasers. Its quality seriously affects the output characteristics of semiconductor lasers, such as device power, wavelength, and polarization characteristics, and affects the reliability and reliability of semiconductor lasers. life. [0004] However, during the packaging process of the semiconductor laser array, due to the difference in expansion coefficient between the heat ...
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IPC IPC(8): G01M11/02
Inventor 刘兴胜吴迪张彦鑫
Owner FOCUSLIGHT TECH