Method and device for verifying low-temperature test capacity of electric and electronic product

Abstract

The invention discloses a method and a device for verifying low-temperature test capacity of an electric and electronic product, which comprises the following steps of: (1), pre-setting an action temperature point of a temperature detection device, requiring that the temperature change rate of a temperature sensing medium of the temperature detection device is less than or equal to 1 DEG C per min, putting a temperature sensing device of the temperature detection device in the interior of a device to be verified, and opening and cooling the device to be verified; (2), when the temperature detection device detects that the interior temperature of the device to be verified is decreased to the pre-set action temperature point, recording an interior temperature value of the device to be verified at this time, namely recording a temperature value of the device to be verified; and (3), calculating a Z value of the temperature of the device to be verified, Z=(temperature value of the device to be verified-median) / standard IQR value, and when |z|<=2, judging that the low-temperature test capacity of the device to be verified is qualified. The invention provides the method for verifying the low-temperature test capacity, which is capable of making a breakthrough in a technology for verifying the low-temperature test capacity, enriching a quality control method of a laboratory and increasing the capacity and the level of the laboratory.

Description

technical field [0001] The invention relates to the technical field of test ability verification, in particular to a method and device for low temperature test ability verification. Background technique [0002] Environmental test is a type of reliability test that studies the influence of the surrounding environment on the function and performance of materials and products. As one of the three basic environmental factors, temperature affects the use of products all the time. Studies have shown that 40% of product field failures are temperature related. [0003] The low temperature test of electrical and electronic products is used to test the ability of components, equipment and other products to be used, transported or stored in a low temperature environment. The low temperature test has a wide range of applications. Electrical and electronic products such as aerospace, ships, household appliances, and electronic components must be subjected to low temperature tests. Th...

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Problems solved by technology

This method has the following disadvantages: 1) It is not possible to set the characteristic point of the proficiency testing device. In this application, it mainly refers to the action temperature point, that is, a specific temperature value at which the device occurs when a certain action occurs. Common low-temperature test equipment calibration devices cannot Set a fixed action temperature point, and cannot obtain a fixed temperature reading point, so it is impossible to implement proficiency testing activities for laboratories participating in proficiency testing; 2) The above-mentioned devices also have the problems of high cost, large volume, and inconvenient transportation. Calibration devices for low-temperature test equipment such as patrol instruments range from a few thousand to tens of thousands. Such expensive calibration equipment should not be used for proficiency testing activities. Ordinary low-temperature test equipment calibration devices are high-precision electronic equipment and are not suitable for general logistics. Transport, if special logistics are used, further increases the cost of proficiency testing activities

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