Surface three-dimensional measurement system with tunable beat-wave linear scanning
An interferometric measurement and line scanning technology, applied in the field of optical measurement, can solve the problems of small measurement range and inability to achieve the effect of improving measurement speed, high resolution, and simplifying the mechanism
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[0030] Attached below image 3 The present invention will be further described with specific embodiments.
[0031] like image 3 As shown, a tunable beat-wave line-scan surface three-dimensional interferometry system, the light emitted by the broadband light source is divided into two paths after passing through the first optical fiber isolator I1 and 3dB-coupler N1, and one path of light passes through the first self- The collimating mirror Z1 is collimated into a parallel beam, and the other light is also collimated into a parallel beam after passing through the second fiber isolator I2 and the second self-collimating mirror Z2. The two beams of parallel light are incident on the same point of the first diffraction grating G1 at an angle Δi, and the function of the first aperture GL1 is to remove stray light. The first diffraction grating G1 disperses the two beams of parallel light into two fan-shaped light sheets whose wavelengths are continuously distributed in space. ...
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