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Detecting method based on spectroscopy detection technology

A detection method and spectral detection technology, applied in the detection field based on spectral detection technology, can solve the problems of low degree of automation and troublesome operation, and achieve the effect of high degree of automation, high detection speed, and elimination of the problem of characteristic peak interference.

Active Publication Date: 2012-07-11
FOCUSED PHOTONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Using this method, it is necessary to measure the interference spectrum, the spectrum to be measured, the matrix and the blank in each process of spectral line separation and analysis. The operation is cumbersome and the degree of automation is low.

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  • Detecting method based on spectroscopy detection technology
  • Detecting method based on spectroscopy detection technology
  • Detecting method based on spectroscopy detection technology

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Experimental program
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Embodiment 1

[0039] figure 1 The flowchart of the detection method based on the spectral detection technology according to the embodiment of the present invention is schematically given. Such as figure 1 As shown, the detection method includes the following steps:

[0040] (A1) Establish a database of characteristic peaks. Any object to be measured (such as element, element or compound) has its own unique spectral line. Spectral detection technology often uses this characteristic to detect the object to be measured;

[0041] The database covers the characteristic peak information corresponding to the interference object that may exist in the wavelength range of the characteristic peak of the object to be tested: there is more than one characteristic peak of the object to be tested, and multiple such databases need to be established; of course, when the sample to be tested When it is frequently encountered and the difference is small or based on the detection experience, it is enough to establis...

Embodiment 2

[0054] According to the application example of the detection method of Embodiment 1 of the present invention in element detection, it is specifically used to analyze the Cd element content in the precious metal waste liquid. The detection method is:

[0055] (A1) The characteristic peaks of Cd are: 228.802nm, 226.502nm.... According to the detection experience of the waste liquid, the characteristic peaks to be used for Cd are selected: 228.802nm. These characteristic peaks are relatively strong and have relatively little interference. Establish a database of Cd characteristic peaks, which covers the interfering elements As, Pt, Rh, Re, Th, Tl, Br, Ni, Ru, Co, Ir that may exist in the wavelength range (228.802nm±0.05nm) of the characteristic peak 228.802nm , Sc, W, the characteristic peaks are 228.812nm, 228.819nm, 228.825nm..., and the identifiable characteristic peak wavelengths are: 189.042nm, 214.423nm, 343.489nm...

[0056] (A2) Use atomic emission spectroscopy to obtain the s...

Embodiment 3

[0062] According to the application example of the detection method of Embodiment 1 of the present invention in element detection, it is specifically used to analyze the Cd element content in the precious metal waste liquid. The detection method is:

[0063] (A1) The characteristic peaks of Cd are: 228.802nm, 226.502nm.... Establish a database of Cd characteristic peaks, which covers the interfering elements As, Pt, Rh, Re, Th, Tl, Br, Ni, Ru, Co, Ir that may exist in the wavelength range (228.802nm±0.05nm) of the characteristic peak 228.802nm , Sc, W, the characteristic peaks are 228.812nm, 228.819nm, 228.825nm..., and the identifiable characteristic peak wavelengths are: 189.042nm, 214.423nm, 343.489nm... Similarly, it is necessary to establish a database covering other characteristic peaks of Cd, such as the characteristic peaks corresponding to the interference elements that may exist in the wavelength range of 226.502nm (226.502nm±0.05nm), and the identifiable characteristic...

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Abstract

The invention provides a detecting method. The detecting method comprises the following steps: (A1) establishing a database, wherein the database contains possible interference objects within a wavelength interval of a characteristic peak of an object to be detected as well as characteristic peak wavelengths thereof and identifiable characteristic peak wavelengths thereof; (A2) obtaining a spectrogram of each object; (A3) searching possible interference objects, which fall within a wavelength interval of the characteristic peak of the object to be detected, as well as the identifiable characteristic peak wavelengths thereof; (A4) searching the identifiable characteristic peak in the spectrogram; if the identifiable characteristic peak is searched, showing that the characteristic peak of the interference object exists within the wavelength interval; if the identifiable characteristic peak is not searched, showing that the characteristic peak of the interference object does not exist within the wavelength interval; and consequently, identifying the interference object and the characteristic peak thereof which affect the characteristic peak of the object to be detected within the wavelength interval of the spectrogram; and (A5) obtaining the characteristic peak of the object to be detected, in which the influence from the interference object is eliminated within the wavelength interval, according to the spectrogram within the wavelength interval and the identified characteristic peak of the interference object so as to obtain the content of the object to be detected in the sample. The detecting method provided by the invention has the advantages of high automation degree, short measuring time and the like.

Description

Technical field [0001] The present invention relates to the detection of objects such as elements, elemental substances or compounds, and particularly to detection methods based on spectral detection technology. Background technique [0002] In ICP spectroscopy products, due to the extremely rich spectral lines excited by the ICP light source, the interference of the spectral lines is relatively serious. The resolution capability of current spectrometers cannot completely separate all the spectral lines, which requires some spectral line separation operations with the help of algorithms. This is also the advantage of full-spectrum direct-reading ICP-OES products over scanning or direct-reading ICP-OES. [0003] In general, the spectral line separation technology is to separate the spectral lines to be analyzed from the interference spectral lines, matrix, and blank background. The current spectral line separation operation is more troublesome (such as PE's MSF algorithm and Varian...

Claims

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Application Information

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IPC IPC(8): G01N21/25
Inventor 俞晓峰吕全超陈文益顾海涛陈莉
Owner FOCUSED PHOTONICS