Method and device for evaluating life of product

Abstract

The invention provides a method and a device for evaluating the life of a product. The method comprises the following steps of: determining key devices of a complete machine equipment product; performing an accelerated life test on each key device, and obtaining the corresponding life characteristic according to accelerated life test data; and evaluating the life of the complete machine equipment product according to the life characteristic of each key device. By the method and the device, time for evaluating the life of the product can be shortened, and the cost of evaluating the life of the product can be reduced.

Description

technical field [0001] The present application relates to the technical field of life evaluation, and in particular, to a product life evaluation method and device. Background technique [0002] At present, with the development of science and technology, the product life is continuously improved; on the other hand, due to the increasingly fierce competition in the industry, the cycle from research and development to production of products is getting shorter and shorter, and the cycle of new product development and performance improvement of old products is shortened to one year or more. Shorter. Therefore, how to quickly evaluate the product life has become an urgent problem to be solved. Otherwise, if the life test is not completed in time, the old product is likely to be eliminated due to its backward performance. [0003] The existing product life evaluation method adopts the accelerated life test method. Accelerated life test (ALT, Accelerated life test) is based on th...

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Problems solved by technology

Once the design limit is exceeded, it is likely to cause abnormal shutdown or even damage to the equipment

Therefore, when the accelerated life test is carried out, the accelerated stress is limited by the narrow range of equipment environmental conditions, resulting in a small acceleration factor and a long test time;

[0008] Secondly, because the wireless base station equipment is relatively complex and has multiple failure modes, it is very difficult to find a suitable acceleration model, which often requires a lot of time and test samples, which greatly increases the test cost;

[0009] Furthermore, the accelerated life test requires multiple wireless base stations as samples. Because the equipment is expensive and the test environment is complicated, the test cost is high and the test is difficult;

[0010] Finally, with the development of science and technology, the continuous application of new materials and new processes, the reliability of wireless base station equipment products continues to increase, and the time spent on life evaluation will also increase correspondingly with the improvement of equipment reliability, which cannot fully meet the needs of rapid need for evaluation

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