Test system and test method of microwave controller
A technology for controlling devices and test systems, applied in electrical testing/monitoring, etc., can solve the problem of high workload of chip performance testing, and achieve the effect of improving testing and testing efficiency
Active Publication Date: 2012-10-03
HUADONG PHOTOELECTRIC TECHN INST OF ANHUI PROVINCE
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Problems solved by technology
Taking the digital control attenuator as an example, the commonly used digital control attenuator is 5 or 6 bits, so at one frequency point, it needs to test a total of 2 5 (32) or 2 6 (64) state data, therefore, the performance detection of this type of chip requires a lot of work
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[0038] The present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.
[0039] refer to figure 1 The circuit shown is a working principle block diagram of a microwave control device testing method according to the present invention. The test circuit includes a DC stabilized power supply 1, an MCU (single chip microcomputer) control circuit 2, a single-end-differential conversion circuit 3, a device to be tested 4 that is a chip to be tested, a vector network analyzer 5, and a computer (PC) 6 .
[0040] The DC stabilized power supply 1 provides power supply for the entire test circuit. In this embodiment, 5V and -5V power supplies can be provided respectively; the test circuit controls the on-off of 6 channels in the single-ended-differential conversion circuit 3 th...
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The invention discloses a test system and a test method of a microwave controller, which belongs to the field of a microware-integrated circuit. The test system comprises a direct current voltage-stabilized power supply, a single chip microcomputer control circuit, a single-ended differential signal conversion circuit, a vector network analyzer and a computer, wherein single-ended TTL(transistor-transistor logic) voltage output by an MCU(microprogrammed control unit) control circuit is converted to be a differential voltage signal by the single-ended differential signal conversion circuit, the on-off state of the differential signals is controlled by the single chip microcomputer control circuit to as to realize the control on the controller, and the performance of the device is detected by the vector network analyzer. The computer controls the vector network analyzer to automatically accomplish the test to the electric parameters of the microwave controller, and meanwhile, the computer can change the test time interval and delay by modifying programs so as to match the vector network analyzer to carry out the efficient test, so that the test and detection efficiency can be greatly enhanced.
Description
technical field [0001] The invention relates to a test system and a test method of microwave control devices, in particular to a test method of microwave control devices such as phase shifting and attenuation, and belongs to the field of microwave integrated circuits. Background technique [0002] In modern microwave and millimeter wave communication, satellite communication, active phased array radar, test instrument and other system circuits, microwave control devices play a pivotal role, involving phase shifting, attenuation, limiting and other devices, mainly used for microwave control Millimeter wave signals are processed by phase adjustment, amplitude change, power protection, etc., so as to achieve the purpose of special changes of microwave and millimeter wave signals in various systems to their circuits. [0003] At present, domestic control devices for microwave circuits generally use two complementary differential signals (0V / -5V) for control. To perform performan...
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IPC IPC(8): G05B23/02
Inventor 吴华夏刘劲松王华窦增昌汪伦源
Owner HUADONG PHOTOELECTRIC TECHN INST OF ANHUI PROVINCE