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Semiconductor device

A technology of semiconductors and basic units, applied in digital memory information, instruments, electrical digital data processing, etc., can solve the problems of unshortened memory cycles and insufficient power reduction, and achieve the effect of reducing power consumption and maintaining data efficiency

Inactive Publication Date: 2012-11-14
RENESAS ELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0057] However, if only the average latency is shortened, the memory access cycle itself is not shortened
Also, insufficient in cutting power

Method used

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  • Semiconductor device
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Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach 1

[0175] Figure 11 It is a figure explaining the structure of Embodiment 1 of this invention. exist Figure 11 in, right with Figure 6 , Figure 8 Elements that are identical or equivalent are marked with the same reference symbol. Below, the main description and Figure 6 The difference of related technology.

[0176] Divided into multiple arrays (basic unit 11) suitable for the pipeline structure synchronized with the clock, based on the cycle of the clock signal CLK, the control signals such as addresses, commands, time signals and IO lines for data transmission are read and written immediately The data signal on the bus (RWBS) is divided, so that the transmission of the control signal and data signal is controlled by the pipeline. Such as Figure 11 As shown, corresponding to the basic unit 11 of the memory array, there is a bidirectional buffer (address / command buffer) 13C connected to the address / command bus and an output (address, command, time signal) of the add...

Embodiment approach 2

[0224] In semiconductor memories, multiple operating specifications are usually switched within the same chip. Next, as Embodiment 2, a description of the burst length 8 of ×36 is shown, and an internal switching specification from Embodiment 1 is shown.

[0225] Figure 16 The configuration of Embodiment 2 when the burst length=8 is schematically shown. In the first embodiment where the burst length=4, the basic unit 11 of the memory array is divided into two parts, but as Figure 16 As shown, in the second embodiment, the basic unit 11 of the memory array is divided into four parts, and the columns BL0 / 1 and BL2 / 3 are assigned to the active regions 10-1, 10-2, 10-3, and 10-4, respectively. , BL4 / 5, BL6 / 7. Compared with the burst length=8 and the number of data terminals=36, the number of data lines of the read-write bus (RWBS) is 72. The address / command bus from the control circuit 6 and the read-write bus (RWBS) connected to the data control circuit 7 have three buffers...

Embodiment approach 3

[0248] Figure 24 is a diagram for explaining burst length switching. The number of data terminals = 36, the burst length is 8, the 8-bit data serially input / output from 1 data terminal is written into or read from 8 columns BL0-7 in the active area, Corresponding to 36 data terminals, read and write 36×8=288 data. The operation in this case is the same as that in the second embodiment.

[0249] Pipeline control by having buffers 13A1, 13B1 between active regions 10-1 and 10-2 at burst lengths 8 to 4 (BL0-3) and between active regions 10-3 and 10-2 The pipeline control by the buffers 13A3 and 13B3 between -4 is invalid (pipeline deactivation) (pipeline stop), and the operation is the same as that of the first embodiment. When the pipeline control of the buffer is disabled, that is, when the pipeline / register function is disabled, the buffers 13A1 , 13B1 , and the buffers 13A3 , 13B3 do not perform a latch operation, but skip input and output. For example, buffers (13A1, 13...

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Abstract

Provided is a semiconductor device having a memory cell array structure capable of maintaining data efficiency and reducing power consumption. The semiconductor device comprises: a memory cell array including a plurality of memory array basic units (11), each including a plurality of memory cells for write and read; a first bus provided common to said plurality of memory array basic units, said first bus allowing transfer of address / control signals thereon, said first bus including at least one first buffer circuit (13A) that operates as a pipeline / register; a second bus (RWBS) provided common to said plurality of memory array basic units, said second bus allowing transfer of write / read data thereon, said second bus including at least one second buffer circuit (13B) that operates as a pipeline / register; a first control circuit (6) that sends said address / control signals on said first bus from one end thereof, sequentially in a sequence of from said memory array basic unit located at a remote end side with respect to said one end of said first bus, to said memory array basic unit at a near end side with respect to said one end of said first bus; and a second control circuit (7) that sends data signals on said second bus from one end thereof, sequentially in a sequence of from said memory array basic unit located at a remote end side with respect to said one end of said second bus to said memory array basic unit at a near end side with respect to said one end of said second bus, said write data transferred from said second bus to each of said memory array basic units being written in each of said memory array basic units, read data from a plurality of said memory array basic units being transferred on said second bus to get to said second control circuit, in a sequence of from said memory array basic unit located at said near end side with respect to said one end of said second bus to said memory array basic unit located at said remote end side with respect to said one end of said second bus, said second control circuit outputting said arrived read data.

Description

technical field [0001] The present invention relates to a semiconductor device, and more particularly, to a semiconductor device including a memory cell array. Background technique [0002] In recent years, in semiconductor memories such as DRAM (Dynamic Random Access Memory, dynamic random access memory), high-performance, high-speed operation, and large-capacity have been continuously developed, and due to DDR (Double Data Rate, double data rate) / The introduction of a structure such as DDR2 / DDR3 significantly increases the data bandwidth of the input and output of the memory. [0003] In order to improve the data bandwidth of the input and output of the memory, the READ (read) and WRITE (write) cycle (tRC: ROW CYCLE TIME) of the memory is improved, and the number of simultaneous operations (parallel number) inside the memory is improved (data The multi-parallelization of lines (IO lines) (increasing the number of parallels), the multi-blocking of memory arrays) lead to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F13/16G11C11/4063
CPCG11C7/1066G11C2207/2272G11C7/10G11C11/4076G11C11/4093
Inventor 广部厚纪
Owner RENESAS ELECTRONICS CORP