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Spinneret plate microscopy instrument

A spinneret and microscope technology, which is applied in the field of detection systems, can solve problems such as inconvenient detection and affect detection accuracy, and achieve the effects of increasing reliability, ensuring accuracy, and avoiding inaccurate detection accuracy.

Active Publication Date: 2012-12-05
CHANGCHUN UNIV OF SCI & TECH +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The problem solved by the present invention is that the existing spinneret mirror inspection instrument makes detection inconvenient and affects the detection accuracy due to manual input of spinneret parameters

Method used

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  • Spinneret plate microscopy instrument
  • Spinneret plate microscopy instrument
  • Spinneret plate microscopy instrument

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Embodiment Construction

[0025] In order to describe the technical content, structural features, achieved goals and effects of the present invention in detail, the following will be described in detail in conjunction with the embodiments and accompanying drawings.

[0026] see figure 1, The spinneret mirror inspection instrument of the present invention includes a processor 1 , a detection parameter acquisition device 2 , a standard parameter acquisition device 3 and a discrimination device 4 . The detection parameter acquisition device 2 obtains the image of the spinneret hole of the spinneret to be tested and the relative position of the spinneret hole and the reference point. For example, the detection parameter acquisition device 2 can include a three-axis Mobile workbench and industrial camera. Place the spinneret to be tested on the workbench, and each spinneret hole on the spinneret to be tested can be photographed by the industrial camera, in order to make the image captured by the industrial...

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Abstract

The invention discloses a spinneret microscopy instrument which comprises a detection parameter acquisition device, a processor, a standard parameter acquisition device and a distinguishing device, wherein the standard parameter acquisition device is used for acquiring the relative position of a standard parameter with a reference point of each spinneret hole from a drawing document of the standard spinneret plate; the detection parameter acquisition device is used for acquiring the relative position of an image with the reference point of each spinneret hole of the to-be-detected spinneret plate; the processor is used for processing the obtained images so as to generate a detection parameter of each spinneret hole of the spinneret plate and further create the corresponding relation between the detection parameter and the reference point; and the distinguishing device is used for distinguishing whether the standard parameter and the detection parameter with equal relative distance are the same so as to judge whether the to-be-detected spinneret plate is qualified or not. Due to the adoption of the spinneret microscopy instrument, the parameters of the spinneret holes of the spinneret plate are not required to be input in a manual manner, so that the measurement is convenient and simple, accordingly, the situation that the detection precision is not accurate due to manual input is avoided, and the reliability of the detection precision is increased.

Description

technical field [0001] The invention relates to a detection system, in particular to a spinneret microscope inspection instrument. Background technique [0002] The spinneret is the matrix (mold) of synthetic fibers. After the raw materials for producing synthetic fibers pass through the micropores of different shapes in the spinneret, ultra-fine, bionic, and different-shaped fiber precursors can be obtained. The equivalent diameter of these fibers is usually between 0.1-2.0 mm. The yarns of chemical fiber products we usually see are composed of thousands of such fiber precursors. For some advanced bionic chemical fiber products, some yarns are composed of tens of thousands of such filaments. In addition to the shape of the fiber precursors, the dimensional accuracy of the fiber precursors directly affects the aesthetics and comfort of textiles. Therefore, the requirements for the shape and dimensional accuracy of the spinneret holes (microholes) of the spinneret are quite...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G01B11/24
Inventor 周红生王晓庆周斌徐世军
Owner CHANGCHUN UNIV OF SCI & TECH
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