Testing system and testing method of back scattering parameters of passive tag
A passive tag, backscattering technology, applied in the direction of cooperating devices, instruments, computer parts, etc., can solve the problem of backscatter parameter testing without passive tags, and achieve the effect of preventing mutual interference and realizing the test.
Active Publication Date: 2013-01-16
AEROSPACE INFORMATION
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Problems solved by technology
However, there is currently no technique for testing the backscatter parameters of passive tags
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[0050] The principles and features of the present invention will be described below with reference to the accompanying drawings. The examples are only used to explain the present invention, but not to limit the scope of the present invention.
[0051] figure 1 It is a side view structure diagram of an embodiment of the passive label backscatter parameter testing system provided by the present invention, figure 2 It is a top view structure diagram of another embodiment of the passive tag backscatter parameter testing system provided by the present invention. The test system can be used for performance test of passive tags working in any frequency band, such as UHF (Ultra High Frequency, UHF) frequency band. Since the system does not have specific restrictions on the test frequency band, the present invention collectively refers to it as the frequency band to be measured. The frequency band to be measured is composed of several predetermined frequencies, and the first used pre...
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The invention relates to a testing system and a testing method of back scattering parameters of a passive tag. The system comprises an antenna frame and a read-write antenna, a receiving antenna, and a plane-shaped isolating plate which are arranged on the antenna frame; a testing frame and the passive tag thereon; a reader-writer; a frequency spectrograph; a computer used for determining the back scattering parameters; the read-write antenna and the receiving antenna are located at both sides of the isolating plate, and the maximum radiation direction is pointed at the center of the passive tag; the isolating plate isolates the signals of the read-write antenna and the receiving antenna; the center of the passive tag and the antenna are vertically placed in the same one plane; the distance between the passive tag and the center read-write antenna are spaced in the plane, the reader-writer sends an incident signal to the read-write antenna to emit and collects a reflected signal sent by the received passive tag; the reader-writer sends the frequency and power of the transmitted incident signal, and power of the collected reflected signal to the computer in real time correspondingly; the frequency spectrograph receives the power of the back scattering signal received by the receiving antenna and sends to the computer. The testing system and the testing method of the back scattering parameters of the passive tag can test the back scattering parameters of the passive tag.
Description
technical field [0001] The invention relates to the field of passive tag testing, in particular to a testing system and method for backscattering parameters of passive tags. Background technique [0002] Radio frequency identification (RFID) technology is a communication technology widely used in logistics, anti-counterfeiting, manufacturing, transportation, retail, national defense, etc. The read-write antenna transmits to the passive tag with a certain power, and the tag antenna of the passive tag receives the signal and sends it to the chip in the passive tag, which processes the signal based on the energy of the signal sent by the tag antenna , and the reflected signal obtained after processing is transmitted through the tag antenna, and the reflected signal is received by the read-write antenna and sent back to the reader. [0003] Passive tags have high operating frequency, long read-write distance, no external power supply, and low manufacturing cost. Therefore, RFID...
Claims
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IPC IPC(8): G06K17/00
Inventor 杨会平王顺仁张尊兰刘鑫
Owner AEROSPACE INFORMATION