Method for preparing oxide surface on surface enhanced raman scattering (SERS) substrate through atomic layer deposition technology
A technology of atomic layer deposition and oxide, applied in the field of surface spectroscopy, to achieve the effect of improving surface inhomogeneity
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Embodiment example 1
[0031] Put the prepared active silver substrate of metal island film into the ALD studio, after vacuuming and purging with nitrogen three times, save the low vacuum state filled with nitrogen, and raise the temperature to 300 °C. According to the operation requirements of ALD, titanium tetrachloride (which is the precursor of titanium oxide) steam pulses, nitrogen purge pulses, water vapor as oxygen source pulses, and nitrogen purge pulses are alternately fed. This is an ALD deposition cycle. The working temperature of the titanium tetrachloride source and the water source are both at room temperature, the pulse length of the titanium source and the water source is both 0.1 second, and the pulse length of the purge and cleaning is 6 seconds. The number of ALD deposition cycles was 50, and the thickness of alumina was about 3 nm. After cooling down, the SERS substrate was taken out.
Embodiment example 2
[0033] It is the same as Embodiment 1, but the SERS substrate is a silver substrate obtained by chemical deposition, and the target oxide layer is silicon oxide. The precursor used is tetraethoxy silicon, the oxygen source is water, the operating temperature of the ALD system is 350 ℃, after 30 times, a silicon oxide thin layer of 3 nm is formed.
Embodiment example 3
[0035] It is the same as Embodiment 1, but the SERS substrate is a gold substrate active with metal electrodes, and the target oxide layer is zirconia. The zirconium precursor used was zirconium n-butoxide, the oxygen source was ozone, and the ALD operating system was at 250 °C. After 10 deposition cycles, a thin layer of zirconia with a thickness of 1 nm was obtained.
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Abstract
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