Planar electromagnetic sensor based sheet damage detection apparatus and method thereof

Abstract

The invention belongs to the field of electromagnetic chromatography imaging in the electromagnetic detection technology, and relates to a planar electromagnetic sensor based sheet damage detection apparatus. The apparatus comprises an electromagnetic flaw detection imaging sensor, an A / D and D / A converting circuit, an FPGA control chip and a host computer, the electromagnetic flaw detection imaging sensor is composed of six uniformly-distributed iron core sensors having differential structures, the six sensors define a planar orthohexagonal detection area, and each of the six sensors comprises an excitation coil and a detection coil; and data of the six sensors are acquired through adopting an intersect sampling mode and are transmitted to the host computer through the FPGA control chip, and the host computer realizes the damage detection of a detected sheet according to each sampled date. The invention simultaneously provides a sheet damage detection method adopting the apparatus. The apparatus and the method have the advantages of simplicity, rapidness, high sensitivity and low cost.

Description

technical field [0001] The invention belongs to the field of electromagnetic tomography in electromagnetic detection technology, and in particular relates to a plate damage detection device and method based on a novel electromagnetic flaw detection imaging sensor. technical background [0002] With the rapid development of modern industry, there are more and more occasions where metal components are used in industrial sites. In the field, the continuous invasion of external factors (such as corrosion, strong force, etc.) makes these originally insignificant micro-injuries merge and other phenomena, which intensifies the damage and often leads to more serious consequences in the end. Therefore, it is necessary to inspect the metal components used in the industrial field in order to update the used components or structures in time to avoid industrial accidents. [0003] Most of the electromagnetic flaw detection sensing structures currently used are single excitation and sing...

AI Technical Summary

Problems solved by technology

[0003] Most of the electromagnetic flaw detection sensing structures currently used are single excitation and single acquisition. The sampling data is too single during use, and it is often impossible to comprehensively evaluate the defect parameters effectively and reasonably; even if some sensing systems use multi-excitation and multi-acquisition modes, but Due to the characteristics of the sensing structure itself, the acquisition signal is too weak, resulting in a design defect that the overall sensitivity of the system is not high

In addition, due to the interference of the microstructure, electrical conductivity, magnetic permeability and other factors of the metal firmware used in the industrial field, it often causes misjudgment of the test results, making the test results inaccurate

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