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Apparatus for measuring drying rate and method for measuring drying rate using the same

A drying rate and equipment technology, applied in the field of measuring drying rate equipment and using the equipment to measure drying rate, can solve the problems of insulation film subjectivity, measurement reliability reduction, measurement error, etc.

Inactive Publication Date: 2014-02-12
SAMSUNG ELECTRO MECHANICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] In addition, the drying rate of the insulating film significantly affects the subsequent process, manufacturing efficiency, reliability, etc. of the packaging substrate
[0008] However, in the prior art, since the dryness rate of the insulating film is determined by workers with the naked eye or through tactile perception, the benchmark for determining the dryness rate of the insulating film is very subjective.
Therefore, measurement errors will be generated among many workers, and the measurement reliability will be reduced

Method used

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  • Apparatus for measuring drying rate and method for measuring drying rate using the same
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  • Apparatus for measuring drying rate and method for measuring drying rate using the same

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Embodiment Construction

[0040] Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

[0041] However, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In the drawings, the shapes and dimensions of elements may be exaggerated for clarity, and the same reference numerals will be used throughout to designate the same or like elements.

[0042] figure 1 is a perspective view schematically showing an apparatus for measuring a drying rate according to an embodiment of the present invention. figure 2 yes figure 1 A cross-sectional view of the roller portion shown in .

[0043] refer to figure 1 and figure 2 , the apparatus 100 for measuring drying rate may include a supporting part...

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Abstract

There are provided an apparatus for measuring a drying rate and a method for measuring a drying rate using the same in order to measure the drying rate of a substrate material for manufacturing an electronic apparatus, the apparatus for measuring a drying rate, including a support part having a substrate seated thereon, and a marking part disposed above the substrate while being vertically and horizontally movable, and forming a marking on the substrate while being in contact with the substrate.

Description

[0001] This application claims priority from Korean Patent Application No. 10-2012-0087384 filed with the Korean Intellectual Property Office on Aug. 9, 2012, the disclosure of which is hereby incorporated by reference. technical field [0002] The present invention relates to an apparatus for measuring the drying rate and a method for measuring the drying rate using the same, more particularly, to an apparatus for measuring the drying rate of a substrate material used for manufacturing an electronic device and a method for measuring the drying rate using the same method. Background technique [0003] Generally, a printed circuit board (PCB) is provided with wiring by laminating copper foil on a plate-shaped surface formed of an insulating material such as resin, and performing processes such as pattern printing, etching, etc. on the laminated copper foil based on the design of the circuit pattern. [0004] The circuit board may be manufactured through a build-up process of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/84
CPCG01N21/84G01N21/892G01N33/32
Inventor 田喜善赵在春张钟允申东周金成贤李春根
Owner SAMSUNG ELECTRO MECHANICS CO LTD