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A cmos image sensor testing device based on fpga technology

A technology of image sensor and test device, applied in the direction of single semiconductor device testing, instruments, simulators, etc., can solve the problems of incomplete consistency of test methods and evaluation standards, inability to compare and evaluate the performance of image sensors, etc., and achieve high-temperature performance testing conveniently and quickly , The test process is convenient, fast, easy to accept and recognize the effect

Active Publication Date: 2016-08-17
CHINA ACADEMY OF SPACE TECHNOLOGY
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Problems solved by technology

[0002] The performance parameters of CMOS image sensors are generally evaluated and measured by the manufacturer during design and production, and typical values ​​are given. However, due to changes in production processes and semiconductor materials, the actual performance parameters when users use image sensors may differ from the typical values ​​given. There are certain discrepancies; in addition, the test methods and evaluation standards of different manufacturers are not completely consistent. When the test standards and parameter dimensions are different, it is impossible to compare and evaluate the performance of image sensors from different manufacturers. Therefore, before the application of COMS image sensor chips, When comparing and selecting the best among different models and screening the same model, a unified performance parameter testing system is needed to test the chip

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  • A cmos image sensor testing device based on fpga technology

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Embodiment

[0024] A CMOS image sensor testing device based on FPGA technology, such as figure 1 As shown, the device includes a darkroom 1, an integrating sphere light source 2, a temperature control box 4, an FPGA image acquisition circuit 5, a guide rail 6, scars cables 7, a PCI acquisition card 9 and a host computer 10;

[0025] The integrating sphere light source 2 has a light outlet 3; the temperature control box 4 has a light inlet;

[0026] The temperature control box 4 is placed on the bottom of the darkroom 1, the FPGA image acquisition circuit 5 and the CMOS image sensor 8 to be tested are placed in the temperature control box 4, and the FPGA image acquisition circuit 5 and the CMOS image sensor 8 to be tested pass through The fixtures are fixedly connected and parallel to the bottom of the darkroom 1; the guide rail 6 is fixed on the top of the darkroom 1; the integrating sphere light source 2 is fixed on the guide rail 6 and can slide on the guide rail 6; the light outlet 3 o...

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Abstract

The invention relates to a CMOS (Complementary Metal-Oxide-Semiconductor Transistor) image sensor testing device on the basis of an FPGA (Field Programmable Gate Array) technology, particularly a performance testing platform on the basis of the EMVA1288 testing standard, and belongs to the technical field of testing of an image sensor. The testing device disclosed by the invention is designed on the basis of the EMVA1288 standard, is rigorous in the defining and testing method of performance parameters and is easy to accept and approve by users; the testing device disclosed by the invention has a simple structure and has a convenient and rapid testing process; a temperature control box is added into the device disclosed by the invention and the temperature of a CMOS image sensor chip to be tested can be changed without integrally moving the testing device, so that the high-temperature performance of the CMOS image sensor to be tested is more convenient and rapid to test.

Description

technical field [0001] The invention relates to a CMOS image sensor testing device based on FPGA technology, in particular to a performance testing platform based on the EMVA1288 testing standard, belonging to the technical field of image sensor testing. Background technique [0002] The performance parameters of CMOS image sensors are generally evaluated and measured by the manufacturer during design and production, and typical values ​​are given. However, due to changes in the production process and semiconductor materials, the actual performance parameters of the image sensor used by the user may differ from the typical values ​​given. There are certain discrepancies; in addition, the test methods and evaluation standards of different manufacturers are not completely consistent. When the test standards and parameter dimensions are different, it is impossible to compare and evaluate the performance of image sensors from different manufacturers. Therefore, before the applica...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G05B19/042
CPCY02P90/02
Inventor 张大宇宁永成刘迎辉齐向昆张海明张红旗蒲瑞民刘艳秋王贺丛山
Owner CHINA ACADEMY OF SPACE TECHNOLOGY