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Transparent body three-dimensional profile detection system based on line structured light refraction imaging

A three-dimensional contour, line structured light technology, applied in measuring devices, optical devices, instruments, etc., can solve the problems of difficult to realize the contour detection of transparent materials, low efficiency, etc., and achieve the effect of convenient measurement and calculation

Inactive Publication Date: 2014-04-16
TANGSHAN YINGLAI SCI & TECH
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Problems solved by technology

[0002] In the field of optical material processing, it is often necessary to measure the profile of transparent materials, such as glass, to obtain information such as its cross-sectional size and volume. Conventional manual measurement methods are inefficient and can only measure a single dimensional parameter.
Optical measurement methods have the characteristics of high efficiency and easy computer automation, and have been widely used in the contour detection of non-transparent materials. However, due to the transmission of light by transparent materials, it is difficult to detect the contour of transparent materials using conventional methods.

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  • Transparent body three-dimensional profile detection system based on line structured light refraction imaging

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[0010] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific diagrams and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0011] refer to figure 1 , the embodiment of the present invention provides a three-dimensional profile detection system for transparent bodies based on line-structured light refraction imaging, including an imaging device 1 and an image controller 4 connected thereto. The imaging device 1 is a CCD camera or a CMOS camera. One side of the imaging device 1 is fixedly installed with a light source generating device 2 along the vertical direction. The structured light of the light source generating device 2 is a word-line laser, and a light receiving plate 3 is arranged below the light sour...

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Abstract

The invention relates to a transparent body three-dimensional profile detection system based on line structured light refraction imaging. The transparent body three-dimensional profile detection system comprises an imaging device and an image controller connected with the imaging device. One side of the imaging device is vertically and fixedly provided with a light source generating device, a light receiving plate is arranged under the light source generating device, and the optical axis of the imaging device form an inclined angle to the optical axis of the light source generating device; light emitted by the light source generating device first penetrates through a transparent material to be detected on the light receiving plate and forms light spots on the light receiving plate, then the light spots enter the imaging device for imagining after being refracted by the transparent material, the imaging device sends an imaged image to the image controller, and the image control processes the received image and then calculates the thickness of the transparent material according to the deflection of image points. According to the transparent body three-dimensional profile detection system based on line structured light refraction imaging, by penetrating a transparent body through line structured laser, the shortcomings in the prior art can be overcome; by means of position offset of a virtual image formed through refraction, the profile detection of the transparent body can be achieved and meanwhile good detection results can be obtained.

Description

technical field [0001] The invention relates to the field of transparent material detection, in particular to a three-dimensional contour detection system of a transparent body based on line-structured light refraction imaging. Background technique [0002] In the field of optical material processing, it is often necessary to measure the profile of transparent materials, such as glass, to obtain information such as its cross-sectional size and volume. Conventional manual measurement methods are inefficient and can only measure a single dimensional parameter. Optical measurement methods have the characteristics of high efficiency and easy computer automation, and have been widely used in the contour detection of non-transparent materials. However, due to the transmission of light by transparent materials, it is difficult to detect the contour of transparent materials by conventional methods. Contents of the invention [0003] In view of the above-mentioned shortcomings of t...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 赵治军袁雷曹晓娜刘长鹤刘鸿鹏
Owner TANGSHAN YINGLAI SCI & TECH