Online on-orbit exposure test deformation test probe for film material and testing method of probe

An exposure test and thin-film material technology, which is applied in the field of space environment effect testing of spacecraft materials, can solve problems such as non-recyclability, non-permanent changes in physical quantities or performance changes, inability to meet the requirements of simple on-orbit testing, reliability and low energy consumption, etc. Achieving the effect of simple structure

Active Publication Date: 2014-05-14
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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Problems solved by technology

[0003] During the orbital exposure of satellite materials, some physical quantities or performance changes are not permanent and cannot be recycled for testing, such as the elastic deformation of satellite polymer film materials with temperature changes
Direct characterization tests on the physical quantities and properties of materials on the ground generally require the use of special equipment, which cannot meet the requirements of simplicity, reliability, light weight, and low energy consumption in on-orbit tests.

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  • Online on-orbit exposure test deformation test probe for film material and testing method of probe

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Embodiment Construction

[0031] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not related to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the ar...

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Abstract

The invention discloses an online on-orbit exposure test deformation test probe for a film material and a testing method of the probe. The probe comprises a bracket, wherein at least one test sample is arranged on the bracket; a first cover plate is arranged above one end of the test sample; a second cover plate is arranged above the other end of the test sample; a third cover plate is arranged below the test sample; a light emitting diode is arranged on the second cover plate; a fourth cover plate is arranged on the light emitting diode; a through hole is formed in the third cover plate; a photoelectric sensor is correspondingly arranged below the through hole; the photoelectric sensor is arranged at the end of the bracket; one end of the bracket is connected with the first cover plate, and the other end of the bracket is connected with the second cover plate and the fourth cover plate. The method comprises the following steps: performing calibration and on-line test, wherein the on-line test comprises the following sub-steps: recording the current generated by the photoelectric sensor which corresponds to the test sample, and comparing current data with the data, which is obtained through calibration performed on the ground, of the test sample, thus obtaining the on-orbit linear length change conditions of the test sample along with the temperature. According to the probe, the deformation of a satellite-used polymer film generated along with the temperature change can be tested on line.

Description

technical field [0001] The invention relates to the field of space environment effect testing of spacecraft materials, in particular to an on-orbit exposure test deformation on-line testing probe for thin film materials and a testing method thereof. Background technique [0002] The on-orbit exposure test of satellite materials plays an irreplaceable role in verifying the performance of satellite external materials, verifying ground simulation test data and calibrating ground simulation test methods, and is of great significance to the development of aerospace technology. A large number of material on-orbit exposure tests have been carried out at home and abroad. These tests can be roughly divided into two categories. One is passive exposure tests, that is, material samples are exposed in space, and performance characterization tests are performed on the ground after recovery to obtain material The data of performance change; one is active exposure test, that is, while expos...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N17/00G01B7/16
Inventor 史亮全小平李存惠王鹢
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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