An automatic continuous impact test circuit and its test method

Abstract

The invention discloses an automatic continuous bump impact test circuit and a test method of the automatic continuous bump impact test circuit, and belongs to the field of power source manufacturing auxiliary equipment. The automatic continuous bump impact test circuit comprises a power supply loop and a power supply control device. In the power supply loop, a total control switch is connected to an ACL line; the ACL line enables a KM1 electromagnetic coil to be connected to an ACN line through a JS1 delayed disconnecting switch; the ACL line enables a JS1 control end to be connected to the ACN line through a JS2 delayed disconnecting switch; the ACL line enables a JS2 control end to be connected to the ACN line through a JS1 delayed disconnecting switch; one end of a KM1 normally-open switch is connected with an adjustable input voltage, the other end of the KM1 normally-open switch is connected to a power socket, a switching power source is connected to the power socket, and the switching power source is connected into a load resistor. The KM1 normally-open switch is controlled by the KM1 electromagnetic coil in the power supply loop to be turned on and turned off. The automatic continuous bump impact test circuit and the test method of the automatic continuous bump impact test circuit have the advantages that under the condition that the energy consumption is reduced, power source aging can be simulated, and elements with the poor performance can be selected.

Description

technical field [0001] The invention relates to an automatic continuous impact test circuit and a test method thereof, belonging to the field of auxiliary equipment for power supply production. Background technique [0002] There must be an aging test in the reliability test of power supply products. Most of the defective products in the aging test are concentrated at the time of power-on and voltage conversion. Therefore, the current aging test method is generally used after a long time of work. Convert another input voltage for testing. This testing method requires a special testing location and a large enough space, and the testing process takes 2-4 hours, which takes a long time and consumes a lot of power, resulting in a waste of time and energy. , the detection efficiency is low. Contents of the invention [0003] Aiming at the above-mentioned problems in the prior art, the present invention provides an automatic continuous impact test circuit and a test method ther...

AI Technical Summary

Problems solved by technology

[0002] There must be an aging test in the reliability test of power supply products. Most of the defective products in the aging test are concentrated at the time of power-on and voltage conversion. Therefore, the current aging test method is generally used after a long time of work. Convert another input voltage for testing. This testing method requires a special testing location and a large enough space, and the testing process takes 2-4 hours, which takes a long time and consumes a lot of power, resulting in a waste of time and energy. , low detection efficiency

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