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A multi-channel probe for logic analysis and its probe assembly

A logic analysis, multi-channel technology, applied in the parts, measuring devices, instruments and other directions of electrical measuring instruments, can solve problems such as inability to disassemble, and achieve the effects of convenient measurement, convenient use, and convenient and neat welding

Active Publication Date: 2018-04-24
RIGOL
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0011] The embodiment of the present invention provides a multi-channel probe for logic analysis and its probe assembly, which is used to solve the problem that the front ends of each probe cannot be disassembled in the prior art

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  • A multi-channel probe for logic analysis and its probe assembly
  • A multi-channel probe for logic analysis and its probe assembly
  • A multi-channel probe for logic analysis and its probe assembly

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Embodiment Construction

[0047] In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.

[0048] The multi-channel probe assembly for logic analysis provided by the embodiment of the present invention includes at least one probe head, and the structure of the probe head is as follows: Figure 2A and as shown in 2B;

[0049] Figure 2B A probe head, comprising: a signal cable 12 and a test terminal 16 located at the first end of the signal cable 12; the test terminal 16 comprises: a plug-in terminal 17 and a ground terminal 18;

[0050] The signal cable 12 has a shielding network and a central signal conductor located in the shielding network; the second end of the signal cable ...

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Abstract

The invention relates to the testing field, in particular to a multi-channel probe for logic analysis and a probe assembly thereof. The multi-channel probe assembly includes at least one probe head; the probe head includes: a signal cable and a test terminal; the test terminal includes: a plug-in terminal and a ground terminal; the signal cable has a shielding network and a central signal conductor; the second end of the signal cable There are two pins, one pin is electrically connected to the plug-in terminal through the central signal conductor, and the other pin is electrically connected to the ground terminal through the shielding net; the two pins can be connected to two of the double-row jacks at one end of the probe body The jacks are plugged into each other. The embodiments of the present invention provide superior signal acquisition performance and user convenience to the greatest extent by designing the topology structure and probe components of a high-performance multi-channel general-purpose probe. The designed replaceable probe head can be connected to the probe body, which is convenient to use and easy to replace, and is used to meet various test requirements.

Description

technical field [0001] The invention relates to the testing field, in particular to a multi-channel probe for logic analysis and a probe assembly thereof. Background technique [0002] Multi-channel probes are used to obtain multiple signals of the device under test, which has significant advantages in more complex signal measurement applications. The most typical application field is as a front-end probe of a logic analyzer or an oscilloscope with logic analysis function. When a more comprehensive analysis of an electronic system is to be performed, it is necessary to collect all the signals that are expected to be observed at the same time, and input them into the tester for analysis through the probe. One end of the probe is connected to a test instrument, such as an oscilloscope or a logic analyzer, and is connected to the other end of the probe through a set of cables. The accessory is connected to the point under test of the electronic system. [0003] Since the mea...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/067
Inventor 史慧张琰王悦王铁军李维森
Owner RIGOL
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