Oscilloscope that displays waveform measurement parameters in trend graphs
A waveform measurement and parameter measurement technology, which is applied in the direction of measuring devices, measuring electrical variables, digital variables/waveform display, etc., can solve problems such as not being stored, avoid blind spots, and improve convenience
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[0023] In the following, with the accompanying drawings and preferred embodiments of the present invention, the technical means adopted by the present invention to achieve the intended purpose of the invention are further described.
[0024] See figure 1 , The oscilloscope for displaying waveform measurement parameters in a trend graph of the present invention includes:
[0025] A display 10;
[0026] A signal processing module 20 has a set of signal input ports 201 for receiving input signals to receive the input signals, and the signal processing module 20 includes a voltage superimposing circuit 21 and an amplifier circuit 22 to perform direct current on the input signal Output after recovery and amplification;
[0027] A sampling control module 30, which is connected to the display 10 and the signal processing module 20, has a waveform data memory 301 and a waveform measurement parameter memory 302, and presets a waveform sampling frequency fs and a waveform measurement parameter...
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