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Oscilloscope that displays waveform measurement parameters in trend graphs

A waveform measurement and parameter measurement technology, which is applied in the direction of measuring devices, measuring electrical variables, digital variables/waveform display, etc., can solve problems such as not being stored, avoid blind spots, and improve convenience

Active Publication Date: 2017-03-01
GOOD WILL INSTR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] When conducting research on electronic material properties or electronic signals, in addition to observing the waveform of the signal, many signal parameters are often related to the research topic. For example, the measurement waveform is defined in IEEE Std181-2003Standard on Transitions, Pulses, and Related Waveforms Or many parameters related to time, voltage value and delay in the pulse, such as frequency (Frequency), period (Period), rise time (Rise time), fall time (Falltime), peak-to-peak value (Pk-pk), amplitude ( Amplitude) and other parameters, so the sampling control module 90 of the existing oscilloscope will have multiple waveform measurement parameter calculation programs built in, and the user can choose to execute different waveform measurement parameter calculation programs to process the waveform sampling data in the sampling control module as When the waveform is to be displayed, the corresponding waveform measurement parameter automatically calculated by the executed waveform measurement parameter calculation program is displayed on the display 70, so the above-mentioned oscilloscope will display as Figure 8 The shown display screen 701, in addition to displaying the waveform P to be displayed, can additionally display waveform measurement parameters such as the frequency of the waveform and peak-to-peak value; however, since the frequency and amplitude of each input signal are constantly changing, therefore , the user observes that the parameter values ​​of the waveform in the above display screen are constantly floating with time. Although the oscilloscope has the function of pausing the display screen, since the above various parameters have not been stored, the user can only see the waveform during the pause. If you want to observe the parameter values ​​of the past time, you must set the cursor measurement by yourself, and because the above-mentioned oscilloscope only displays the waveform and instantaneous parameter values, researchers tend to ignore the waveform for a long time when conducting various researches. It is easy to cause blind spots in the research and observation, so the existing oscilloscopes are still not ideal and need to be improved

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  • Oscilloscope that displays waveform measurement parameters in trend graphs
  • Oscilloscope that displays waveform measurement parameters in trend graphs
  • Oscilloscope that displays waveform measurement parameters in trend graphs

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Embodiment Construction

[0023] In the following, with the accompanying drawings and preferred embodiments of the present invention, the technical means adopted by the present invention to achieve the intended purpose of the invention are further described.

[0024] See figure 1 , The oscilloscope for displaying waveform measurement parameters in a trend graph of the present invention includes:

[0025] A display 10;

[0026] A signal processing module 20 has a set of signal input ports 201 for receiving input signals to receive the input signals, and the signal processing module 20 includes a voltage superimposing circuit 21 and an amplifier circuit 22 to perform direct current on the input signal Output after recovery and amplification;

[0027] A sampling control module 30, which is connected to the display 10 and the signal processing module 20, has a waveform data memory 301 and a waveform measurement parameter memory 302, and presets a waveform sampling frequency fs and a waveform measurement parameter...

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Abstract

The invention relates to an oscilloscope capable of displaying a waveform measurement parameter by a tendency chart. The oscilloscope is composed of a display, a signal processing module and a sampling control module. The sampling control module connected with the display and the sampling control module includes a waveform data memory and a waveform measurement parameter memory; and a plurality of waveform measurement parameter calculation programs are established inside the module. After receiving an input signal processed by the signal processing module, the sampling control module carries out sampling on the input signal to obtain a group of waveform sampling data; waveform measurement parameters corresponding to a plurality of time points are calculated by using the waveform measurement parameter calculation programs and are stored into the waveform measurement parameter memory; the waveform sampling data are processed into a to-be-displayed waveform and the waveform measurement parameters are processed to form a tendency chart for displaying the relation between waveform measurement parameters and time; and then the display carries out displaying. Therefore, the user can observe the waveform measurement parameters by the tendency chart, thereby realizing convenient waveform measurement; and the application value of the oscilloscope is improved.

Description

Technical field [0001] The invention relates to an oscilloscope, especially an oscilloscope that displays waveform measurement parameters in a trend graph. Background technique [0002] Oscilloscope is an instrument used to measure the waveform of electronic signals. It is commonly used to detect and study the characteristic curves of electronic signals and electronic components. It is one of the most commonly used research equipment in the research of electronic materials and electronic signals. [0003] See Figure 7 , The main circuit modules in the oscilloscope include: [0004] A display 70; [0005] A signal processing module 80, which has a set of signal input ports 81 to receive the input signal, and output the input signal after DC restoration and amplification processing. The general signal processing module includes a voltage superimposition circuit and an amplification circuit To superimpose and amplify the input signal voltage; [0006] A sampling control module 90, which ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R13/00
Inventor 王鸿杰
Owner GOOD WILL INSTR