Semiconductor point type temperature measurement system
A semiconductor, point-type technology, applied in the field of sensing and detection systems, can solve the problems that the safety and reliability of the equipment cannot be effectively guaranteed, the hot spots of the equipment cannot be found in time, and the equipment lacks tracking and monitoring means, etc., and achieves simple structure and small size. , a wide range of effects
Inactive Publication Date: 2015-02-25
SHENZHEN POWER SUPPLY BUREAU +1
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Problems solved by technology
[0003] At present, most of the monitoring methods for power equipment or electrical connection points are carried out regularly by hand-held infrared thermometers. It is difficult to achieve safe and accurate temperature measurement. The equipment lacks tracking and monitoring methods, and the hot spots of the equipment cannot be found in time, and the safety and reliability of the equipment cannot be guaranteed. to effective guarantee
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Embodiment Construction
[0016] In a basic embodiment, the present invention provides a semiconductor point-type temperature measurement system, which uses the property that the light reflectance of semiconductor materials changes with temperature when the wavelength of incident light is constant, through Measure the intensity of light reflected by semiconductor materials to measure the temperature of the measured object.
[0017] In this embodiment, the system is implemented mainly by using the property that the absorption spectrum of the semiconductor material changes with temperature. When light of a certain wavelength passes through a semiconductor material, the main absorption-type intrinsic absorption is caused, that is, the absorption caused by the excitation of electrons from the valence band to the conduction band. For direct transition materials, the photon energy hv that can cause this absorption must be greater than or equal to the forbidden band width E of the material g ,which is:
[0...
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The invention relates to a semiconductor point type temperature measurement system. According to the system, temperature measurement is carried out on a tested object by measuring the intensity of reflected light of semiconductor materials through the characteristic that the light reflectivity of the semiconductor materials is changed along with the change of temperature when the incident light wavelength is not changed. The semiconductor point type temperature measurement system has the advantages that high insulativity is achieved, electromagnetic interference and corrosion resisting is achieved, explosion preventing and lightening protection are achieved, the system can work under severe environment, measurement precision is high, the range is large, responses are sensitive, a temperature detection probe is simple in structure, small in size and convenient to mount, and detection can be achieved in a multi-unit networking mode.
Description
technical field [0001] The invention relates to the technical field of sensing and detection systems used in the field of comprehensive monitoring of power equipment, in particular to a semiconductor point-type temperature measurement system. Background technique [0002] Many electrical equipment in industrial and agricultural production, such as high-voltage switchgear, high-voltage cables, etc., operate under high voltage and high current conditions. Due to mechanical vibration, contact ablation and other reasons during use, the temperature of the contact may rise, causing oxidation of the contact, further increasing the contact resistance, further increasing the temperature, and then local welding or sparks or even arcs The discharge will affect the surrounding insulating materials, eventually causing damage to electrical equipment and causing accidents. For electrical connection parts, such as high-voltage switchgear contacts and contacts, dry-type transformers, box-ty...
Claims
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Inventor 张欣黄荣辉向真仝芳轩张宁
Owner SHENZHEN POWER SUPPLY BUREAU