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Shock insulator detection method and device

A detection method and technology for spacers, applied in nonlinear optics, instruments, optics, etc., can solve the problems of low efficiency and reliability, manual detection of spacers missing, achieve high efficiency and reliability, and avoid human factors. the effect of

Inactive Publication Date: 2015-02-25
HEFEI BOE OPTOELECTRONICS TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] The present invention aims at the problem of low efficiency and reliability of manual detection of the existing lack of spacers, and provides a spacer detection method and equipment with high efficiency and reliability

Method used

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  • Shock insulator detection method and device

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Embodiment 1

[0034] Such as Figure 2 to Figure 4 As shown, the present embodiment provides a spacer detection method, which is used to detect whether the spacer 11 on the display substrate is completely missing.

[0035] Among them, the display substrate is preferably a color filter substrate, because the spacers 11 are mostly provided in the color filter substrate. Of course, it is also feasible if the display substrate is an array substrate or the like. Meanwhile, the display substrate may be used in a liquid crystal display device, an organic light emitting diode (OLED) display device, and the like.

[0036] The spacer detection method of the present embodiment specifically includes the following steps:

[0037] S101 . Collect an image of the detection area of ​​the display substrate. The detection area is located in the display area of ​​the display substrate. There are a plurality of spacer levels for setting spacers 11 in the detection area.

[0038] That is to say, in the displa...

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Abstract

The invention provides a shock insulator detection method and device and belongs to the technical field of display substrate detection. The shock insulator detection method and device can solve the problems that existing shock insulator overall deficiency depends on manual detection and is low in efficiency and reliability. The shock insulator detection method comprises the steps that images in a detection region of a display substrate are collected, wherein the detection region is located in a display region of the display substrate, and multiple shock insulator positions used for arrangement of shock insulators are arranged in the detection region; the detection region is divided into multiple identical comparison units, wherein display structures, except the shock insulators, of all the comparison units are the same, and the shock insulator positions in at least a part of the comparison units are different in distribution; the image of each comparison unit is compared with the images of the adjacent comparison units in sequence, and if comparison results are different, a defect is recorded; the total number of the defects in the detection region is compared with a preset critical value, and if the total number of the defects is smaller than the critical value, it is determined that the display substrate has shock insulator overall deficiency.

Description

technical field [0001] The invention belongs to the technical field of display substrate detection, and in particular relates to a spacer detection method and equipment. Background technique [0002] The spacer (PS) is arranged between the two display substrates (array substrate and color filter substrate) of the liquid crystal display panel to maintain the distance between the display substrates and the thickness of the liquid crystal cell. On the display substrate, the spacers are circulated in units of "spacer circulation units", and each spacer circulation unit includes N (N is greater than or equal to 2) pixel units arranged together (that is, each spacer The circulation unit includes a "region" of the display substrate), and there are multiple spacers in it, and the distribution of the spacers in each spacer circulation unit is the same, and the multiple spacer circulation units are arranged circularly to form the display substrate The display area (area used for disp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13
CPCG02F1/1309G02F1/1339
Inventor 崔秀娟李晶晶吴斌李启明
Owner HEFEI BOE OPTOELECTRONICS TECH