Test circuit and test device
A technology for testing circuits and circuits, which is applied in the direction of single semiconductor device testing, non-electric variable control, instruments, etc., can solve the problems of high cost of manpower and material resources, long test cycle, etc., to avoid excessive temperature, save test cycle and manpower Material effect
Inactive Publication Date: 2015-03-18
OCEANKING DONGGUAN LIGHTING TECH +2
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Problems solved by technology
[0004] In summary, the current LED aging test method has a long test cycle and high manpower and material costs.
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[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0029] Please refer to figure 1 , figure 1 It is a circuit diagram of a test circuit provided by an embodiment of the present invention, including:
[0030] It includes a DC stabilized power supply 101, an AC-DC conversion circuit 102, an over-temperature detection circuit 103, a first control switch 104, a second control switch 105, an accumulative timer 106 and at least two tested light-emitting diodes 107, wherein,
[0031] The first control swit...
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The embodiment of the invention discloses a test circuit and a test device. The test circuit includes a direct current voltage-stabilized power source, an alternating current-direct current conversion circuit, an over-temperature detection circuit, a first control switch, a second control switch, an accumulative timer and at least two measured two light-emitting diodes, wherein the first control switch is connected in series between a working power source input end of the direct current voltage-stabilized power source and a commercial power source, the second control switch and the at least two measured light-emitting diodes are connected in series between a positive pole output end and a negative pole output end of the direct current voltage-stabilized power source, the over-temperature detection circuit detects the temperature of each measured light-emitting diode and drives the second control switch to be switched off when the temperature of at least one of the measured light-emitting diodes exceeds a high temperature threshold value, and the accumulative timer drives the first control switch to be switched off when preset test time comes. With the test circuit and the test device of the invention adopted, aging test efficiency can be improved, and a test period can be shortened, and manpower and material resources can be saved.
Description
technical field [0001] The invention relates to the field of electronic circuits, in particular to a test circuit and a test device. Background technique [0002] In the aging test of light-emitting diodes (Light Emitted Diode, LED), in order to shorten the test period, the LED under test is usually placed in a high-temperature box, and the temperature of the high-temperature box is set close to the upper limit of the junction temperature of the LED. Test the corresponding photoelectric parameters after the LED under test is energized and aged for a certain period of time in a high temperature environment, for example, test the corresponding photoelectric parameters after aging for 100, 240, 500, 1000, 2000... hours. [0003] At present, the common testing method is timing by manually playing a stopwatch or recording the starting aging time, which is inefficient. And because the photoaging test of LED is a long-term power-on test process, the temperature of the high-tempera...
Claims
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IPC IPC(8): G01R31/26G05D23/24
Inventor 周明杰胡波
Owner OCEANKING DONGGUAN LIGHTING TECH