Perpendicular magnetization film test device
A technology of perpendicular magnetization and testing device, applied in the direction of measurement device, polarization influence characteristics, material analysis by electromagnetic means, etc., can solve problems such as inconsistency, and achieve the effect of simple operation, high repeatability and stability
Active Publication Date: 2015-03-25
HUAQIAO UNIVERSITY
View PDF1 Cites 2 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
However, since the magnetization state of the thin film sample is related to the magnetic history of the measurement process, the sample test results after repeated magnetization measurements may be inconsistent
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment 1
[0038] The vertical magnetization thin film testing device of the present invention adopts the magneto-optical Kerr effect to characterize the magneto-optical characteristics of the perpendicular magnetization thin film, and adopts the magnetoelectric Hall effect to characterize the magnetoelectric characteristic of the perpendicular magnetization thin film. Please see figure 1 , the perpendicular magnetization thin film testing device includes a uniform large magnetic field generating unit, a magneto-optical characteristic measuring unit, a magnetoelectric characteristic testing unit, a magnetic field measuring unit and a computer 19 and other components.
[0039] The uniform large magnetic field generation unit is realized by using a programmable variable current rate magnetic field scanning power supply 13 to drive a single wire wrapped double yoke single tuned adjustable air gap electromagnet 12 . Please refer to the structure of the electromagnet 12 figure 2 and image...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
| Property | Measurement | Unit |
|---|---|---|
| wavelength | aaaaa | aaaaa |
| wavelength | aaaaa | aaaaa |
| width | aaaaa | aaaaa |
Login to View More
Abstract
The invention discloses a perpendicular magnetization film test device and relates to an electromagnetic detecting device. A computer, a laser unit and a polarizing prism form an incidence light path which is used for projecting incident light to a sample rack; a polarization detecting prism and a photoelectric detector form a reflecting light path; a magnetic field scanning power supply is electrically connected to an electromagnet; the electromagnet is a single-solenoid double-yoke electromagnet with magnetic field intensity not lower than 1T when the magnetic field air gap is 30mm, the magnetic field direction is horizontal when the electromagnet is seated, an aperture directly extending to the magnetic field gas gap is formed in a polar head axis of a non-solenoid side; four adjustable conductive probes which are distributed in a crossed manner are arranged on the sample rack; an output port of a constant-current source is connected to the pair of opposite conductive probes on the sample rack; an input port of a nanovoltmeter is connected to the other pair of conductive probes on the sample rack; two control output ports of a computer are respectively connected to control input ports of a magnetic field scanning power supply and the constant-current source; and two signal input ports of the computer are respectively connected to output ports of a photoelectric detector and the nanovoltmeter.
Description
technical field [0001] The invention relates to an electromagnetic detection device. Background technique [0002] Due to its various effects including magneto-optic, magnetoelectric, magnetic anisotropy and magnetostriction, perpendicular magnetization films are an important class of functional materials in microelectronics and information technology, and are widely used in micro-motors, magnetic sensors, etc. , Optical communications, especially in the field of high-density magnetic storage technology. However, as the thickness of the magnetic layer in the film system decreases to the nanometer scale, the magnetic moment of the system decreases, which increases the difficulty of magnetic characterization of the magnetic ultra-thin film system. With the improvement of modern thin film preparation technology and application design requirements, the nanostructured perpendicular magnetic ultrathin film system containing only a few atomic layers has become an extremely importa...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/21G01N27/00
Inventor 王可陈若飞吴雪峰庄凤江
Owner HUAQIAO UNIVERSITY