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Modeling Method of Accelerated Degradation Test Based on Fuzzy Theory

A technology of accelerated degradation test and fuzzy theory, applied in the field of accelerated degradation test, can solve problems such as fuzzy theory research of accelerated degradation test, and achieve the effect of reference value and reasonable results

Active Publication Date: 2017-04-19
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Apart from this, so far there has been no study of fuzzy theory in accelerated degradation tests

Method used

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  • Modeling Method of Accelerated Degradation Test Based on Fuzzy Theory
  • Modeling Method of Accelerated Degradation Test Based on Fuzzy Theory
  • Modeling Method of Accelerated Degradation Test Based on Fuzzy Theory

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Embodiment

[0080] The failure mechanism of a certain transistor was analyzed, and it was found that the temperature is its sensitive stress, and the Arrheniz model was selected as the accelerated model to carry out the accelerated degradation test on the transistor. It is known that when the temperature is higher than 270°C, the degradation curve has an obvious inflection point, indicating that a new high-temperature failure mechanism has been introduced at this time. Therefore, the test temperature is within 270°C. For this reason, the temperature stress in the test was set to 200°C, 220°C, 240°C and 260°C respectively. Next sample for each stress level. The sampling interval is 0.1 hour, and 500 data are collected under each stress; the parameters in the Arrheniz model are set as: A=8.3*10 5 , Ea=0.5eV, σ=0.5; the initial value is 0, the performance threshold is 500; the actual working temperature of the product is 55°C. Experimental data are obtained through matlab simulation.

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Abstract

The invention discloses an accelerated degradation experiment modeling method based on a fuzzy theory. The accelerated degradation experiment modeling method comprises the specific steps of 1 utilizing the fuzzy theory to enable degradation data to be reasonably fuzzified so as to obtain fuzzy degradation data, 2 utilizing fuzzy degradation regression to establish an accelerated degradation test fuzzy linear degradation model and 3 performing model parameter evaluation and reliability degree prediction. According to the established fuzzy linear degradation model, a fuzzy evaluation value of a model parameter is given, and a fuzzy life prediction interval and a fuzzy reliability interval of a product are further given. Compared with a point estimated value given by means of a traditional statistical analysis method, the result obtained by means of the accelerated degradation experiment modeling method is reasonable and has reference value.

Description

technical field [0001] The invention is an accelerated degradation test modeling method based on fuzzy theory, belongs to the technical field of accelerated degradation tests, and is used for solving technical problems in the field of reliability and system engineering. Background technique [0002] With the development of science and technology, the requirements for product reliability are getting higher and higher. For products with long life and high reliability, the accelerated life test (ALT—Accelerated Life Testing) that needs to use the failure data observed in the test can no longer meet the requirements. . Due to the fact that long-life and high-reliability products sometimes fail to be observed in ALT or cannot be observed at all, this brings great difficulties to product life and reliability evaluation. Accelerated degradation test (ADT—Accelerated Degradation Testing) was developed under this background. The so-called accelerated degradation test is to use the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06N7/02
Inventor 李晓阳许瀚孙富强
Owner BEIHANG UNIV