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Washing method for magnetic pollution of magnetic force microscope probe

A technology of magnetic force microscope and probe, which is applied in the direction of cleaning methods and utensils, chemical instruments and methods, etc., which can solve the problems of poor magnetic pollution effect and poor cleaning effect of probes, and achieve good cleaning effect, less time-consuming and easy operation. simple effect

Active Publication Date: 2015-04-08
CHANGCHUN UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The disadvantage is that oxides are easily produced on the surface, and the cleaning effect on heavily polluted probes is not good
The third is to use the pollution probe to squeeze the polypropylene film, and use the characteristics of the organic film to stick the dirt. This method can complete the cleaning of the probe without removing the probe, but this method is harmful to mild The cleaning effect of the pollution probe is better, but the effect on severe magnetic pollution is relatively poor

Method used

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  • Washing method for magnetic pollution of magnetic force microscope probe
  • Washing method for magnetic pollution of magnetic force microscope probe
  • Washing method for magnetic pollution of magnetic force microscope probe

Examples

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Effect test

example 1

[0028] Such as figure 2 As shown, the BOPP film 3 is not added to the surface of the NdFeB strong magnet 2, the magnetic contamination probe 4 is placed on the magnetic force microscope, the equipment is set to the contact mode, and the NdFeB strong magnet 2 is placed on the sample stage 1 of the magnetic force microscope. Scan and image the NdFeB strong magnet 2, select a flat area as a new scanning area, manipulate the magnetic pollution probe 4 close to the surface of the NdFeB strong magnet 2, set the Setpoint value further after stabilization, and increase the magnetic pollution probe The pressure of 4 makes the magnetic pollution probe 4 contact with the NdFeB strong magnet 2. Note that the Setpoint setting should not be too large, and the magnetic pollution probe 4 will retreat after contacting for 5 seconds. Such as image 3 The pollutants above the needle tip and the particles with a lower degree of surface adhesion were adsorbed after cleaning, but the cleaning eff...

example 2

[0030] Such as Figure 4 As shown, cover the BOPP film 3 on the NdFeB strong magnet 2, set the magnetic force microscope to the contact mode, fix the BOPP film 3 on the strong magnet 2, and place the fixed sample on the sample stage 1 of the magnetic force microscope. The film 3 is scanned and imaged, and a flat area is selected as a new scanning area, and the magnetic contamination probe 4 is manipulated close to the surface of the BOPP film 3, and the Setpoint value is increased after stabilization, so that the magnetic contamination probe 4 is pressed into the BOPP film 3, and the pressure is controlled. The penetration depth is 50-100nm, and the demagnetization pollutes the probe 4 after staying for 5s. Such as Figure 5 Shown is the cleaned tip, magnetic contamination is well removed.

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Abstract

The invention discloses a washing method for magnetic pollution of a magnetic force microscope probe. The washing method comprises the following steps: (1) fixing a BOPP (Biaxially Oriented Polypropylene) thin film on a strong magnet and putting the magnet on a sample platform; (2) imaging the BOPP thin film fixed on the magnet according to a conventional method, and selecting a more flat region to be used as a target region; (3) driving the probe in the target region, pressing a needle tip into the BOPP thin film and keeping the needle tip in the BOPP thin film; and (4) driving the probe to be released from the BOPP thin film o and repeating pressing and needle quitting movement. The washing method is simple to operate and consumes less time; magnetic pollutants stuck on the needle tip can be effectively removed and the probe without the pollution can be repeatedly utilized.

Description

technical field [0001] The invention relates to a method for cleaning the magnetic contamination of the needle tip of a magnetic force microscope. Background technique [0002] Magnetic Force Microscope (MFM) is a surface analysis instrument used to detect the strength and distribution of magnetic domains on the surface of samples. The magnetic force microscope images by controlling the force between the needle tip and the sample. Therefore, whether the image scanned by the magnetic force microscope accurately reflects the magnetic domain structure of the sample is closely related to the surface structure of the needle tip. The needle tip determines the resolution and The quality of the scanned image. Magnetic force microscope probes are usually coated with thin films of Fe, Co, Ni, etc., which are easily affected by the magnetic field to generate magnetism. However, the operating object of the magnetic force microscope is usually a magnetic sample, so the needle tip will i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B08B7/00
CPCB08B7/00
Inventor 王作斌张超张文晓刘劲芸董莉彤宋正勋翁占坤范思哲
Owner CHANGCHUN UNIV OF SCI & TECH
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