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Second-order system test device

A technology of a test device and a second-order system, which is applied to measurement devices, instruments, etc., can solve the problems of unstable performance of the second-order system test device, waste of resources and costs, and achieve the effects of avoiding waste, saving resources and reducing costs.

Inactive Publication Date: 2015-05-27
杨光
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] At present, the performance of the second-order system test device is not stable enough, resulting in a waste of resources and an increase in cost

Method used

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  • Second-order system test device

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Effect test

Embodiment 1

[0015] The invention provides a test device for testing the second-order system, which is characterized in that: the test device for testing the second-order system includes a damping rod (1) for the test device for testing the second-order system, and a shell structure (2) for the test device for testing the second-order system ), test the fixed structure of the second-order system test device (3), test the second-order system test device damping rod (1) and test the second-order system test device shell structure (2) in a detachable way, test the second-order system test The device fixing structure (3) is detachably connected to the shell structure (2) of the second-stage system test device; the shell structure (2) of the test second-stage system test device is a straight cylindrical structure with one end or two Ends are threaded.

[0016] The test device for testing the second-order system according to claim 1, characterized in that: the housing structure (2) of the test d...

Embodiment 2

[0021] The invention provides a test device for testing the second-order system, which is characterized in that: the test device for testing the second-order system includes a damping rod (1) for the test device for testing the second-order system, and a shell structure (2) for the test device for testing the second-order system ), test the fixed structure of the second-order system test device (3), test the second-order system test device damping rod (1) and test the second-order system test device shell structure (2) in a detachable way, test the second-order system test The device fixing structure (3) is detachably connected to the shell structure (2) of the second-stage system test device; the shell structure (2) of the test second-stage system test device is a straight cylindrical structure, with one end or two Ends are threaded.

[0022] The test device for testing the second-order system according to claim 1, characterized in that: the shell structure (2) of the test de...

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Abstract

A second-order system test device comprises a second-order system test device damping rod (1), a second-order system test device shell structure (2), and a second-order system test device fixing structure (3). The second-order system test device damping rod (1) and the second-order system test device shell structure (2) are detachably connected. The second-order system test device fixing structure (3) and the second-order system test device shell structure (2) are detachably connected. The second-order system test device shell structure (2) is of a straight cylinder-shaped structure, and both ends are smooth. The second-order system test device fixing structure (3) is a piston with a shank, and is in threaded connection with the second-order system test device shell structure (2). The second-order system test device of the invention has the advantage that the device can be reused, so that resources are saved, waste is avoided, and the cost is reduced.

Description

technical field [0001] The invention relates to a test device for a second-order system, and in particular provides a test device for testing a second-order system. Background technique [0002] At present, the performance of the second-order system test device is not stable enough, resulting in a waste of resources and an increase in cost. Contents of the invention [0003] The purpose of the present invention is to save resources and reduce costs, and especially provides a test device for testing the second-order system. [0004] The invention provides a test device for testing the second-order system, which is characterized in that: the test device for testing the second-order system includes a damping rod (1) for the test device for testing the second-order system, and a shell structure (2) for the test device for testing the second-order system ), test the fixed structure of the second-order system test device (3), test the second-order system test device damping rod...

Claims

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Application Information

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IPC IPC(8): G01D21/00
Inventor 杨光
Owner 杨光
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