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Serial communication test device, system including the same and method thereof

A technology of serial communication and testing equipment, which is applied in the field of serial communication testing equipment, and can solve problems such as inability to detect errors correctly

Active Publication Date: 2015-06-10
HYUNDAI MOTOR CO LTD +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, conventional error detection schemes take a considerable amount of time to detect or correct errors, and cannot correctly detect errors

Method used

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  • Serial communication test device, system including the same and method thereof
  • Serial communication test device, system including the same and method thereof
  • Serial communication test device, system including the same and method thereof

Examples

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Embodiment Construction

[0021] Although the exemplary embodiment is described as using a plurality of units to perform the exemplary processing, it should be understood that the exemplary processing may also be performed by one or more modules. In addition, it should be understood that the term "controller" refers to a hardware device including a memory and a processor. The memory is configured to store various modules, and the processor is specifically configured to execute the modules to perform one or more processes described further below.

[0022] In addition, the control logic of the present invention can be implemented as a non-transitory computer-readable medium containing executable program instructions executed by a processor, a controller, and the like. Examples of computer readable media include, but are not limited to, ROM, RAM, compact disk (CD)-ROM, magnetic tape, floppy disk, flash drive, smart card, and optical data storage device. The computer-readable recording medium may also be dis...

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Abstract

A serial communication test device, a system including the same, and a method thereof are provided, which relate to a technology that allows a master chip and a slave ship for Serial Peripheral Interface (SPI) communication to double-check data to increase reliability. The serial communication test device includes an interface that is configured to transmit and receive data to and from an external chip. A controller is configured to store data to be error-checked in a register to output the stored data to the external chip through the interface and to store data received from the external chip through the interface in a data storage unit. The controller compares the data stored in the register with the data stored in the data storage unit and determines whether the data stored in the register is substantially similar to data to be error-checked.

Description

Technical field [0001] Embodiments of the present invention relate to a serial communication test device, a system including the serial communication test device, and a method thereof, and more particularly to a master chip and a slave chip that allow serial peripheral interface (SPI) communication Technology to check data to improve reliability. Background technique [0002] Generally, a serial peripheral interface (SPI) device is installed in a master chip (for example, CPU), so that the SPI device performs data between the master chip and a slave chip (for example, peripheral devices such as multimedia devices) Communication. The SPI device is configured to utilize a serial communication scheme. Different from other serial communication schemes, by using clock synchronization, the SPI device enables the master chip and the slave chip to communicate with each other at the same time. In other words, the SPI device enables the CPU and the peripheral device to communicate with ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/221G06F11/00G06F11/0727G06F13/42G06F11/0745
Inventor 朴忠燮李智行赵疆熙张斗赈
Owner HYUNDAI MOTOR CO LTD