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Field-effect transistor driving circuit based motor temperature control test system

A field effect tube and drive circuit technology, applied in the field of motor temperature control test system, can solve problems such as low efficiency, slow drive speed, and inability to control the working temperature of the motor, so as to improve detection efficiency, increase drive speed, and low system cost Effect

Inactive Publication Date: 2015-07-29
CHENGDU CHENGBANG POWER TEST INSTR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the driving speed of the traditional motor test system is slow, and the efficiency is low when detecting the temperature of the motor, which leads to the motor test system not being able to control the operating temperature of the motor in time

Method used

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  • Field-effect transistor driving circuit based motor temperature control test system
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  • Field-effect transistor driving circuit based motor temperature control test system

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Embodiment

[0027] like figure 1 As shown, the present invention consists of a single-chip microcomputer 1, a power supply module 2 connected to the single-chip microcomputer 1, a motor speed control module 3, a speed signal processing module 5, a display 7, a temperature storage module 10, and a measured motor connected to the motor speed control module 3. Motor 4, a speed sensor 6 and a temperature sensor 8 connected to the motor 4 to be tested, a band-pass filter circuit 9 connected to the temperature sensor 8, the speed sensor 6 is also connected to the rotational speed signal processing module 5, and the power module 2 are also respectively connected with the motor speed control module 3 and the temperature storage module 10. In order to realize the purpose of the present invention, the present invention is also provided with a field effect tube drive circuit 11 between the single chip microcomputer 1 and the band-pass filter circuit 9.

[0028]Wherein, the single-chip microcomputer ...

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Abstract

The invention discloses a field-effect transistor driving circuit based motor temperature control test system. The system is composed of a single-chip microcomputer (1), a power module (2), a motor speed control module (3), a speed signal processing module (5), a display (7) and a temperature storage module (10) connected with the single-chip microcomputer (1), a tested motor (4) connected with the motor speed control module (3), a speed sensor (6) and a temperature sensor (8) connected with the tested motor (4) and a band-pass filter circuit (9) connected with the temperature sensor (8). The power module (2) is connected with the motor speed control module (3) and the temperature storage module (10), and a field-effect transistor driving circuit (11) is further arranged between the single-chip microcomputer (1) and the band-pass filter circuit (9). Due to the action of the field-effect transistor driving circuit, driving speed of the system can be increased, so that test efficiency of the motor temperature is improved.

Description

technical field [0001] The invention relates to a motor test system, in particular to a motor temperature control test system based on a field effect tube drive circuit. Background technique [0002] With the development of the national economy and science and technology, motors play an increasingly important role in all walks of life. At the same time, with the development of various industries, higher and higher requirements are put forward for motor products, so motor products need to pass some test items to verify whether their characteristics meet the application requirements. Therefore, the motor testing technology is of great significance to the performance verification of the motor. [0003] However, the driving speed of the traditional motor test system is slow, and the efficiency is low when detecting the temperature of the motor, so that the motor test system cannot control the working temperature of the motor in time. Contents of the invention [0004] The pu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/34
Inventor 程社林余仁伟曹诚军杨忠敏
Owner CHENGDU CHENGBANG POWER TEST INSTR