A stray light measuring device and measuring method
A measurement method and stray light technology, which is applied in the direction of measuring device, optical instrument test, machine/structural component test, etc., can solve the problem of stray light influence degree, etc., and achieve the effect of simple principle
Active Publication Date: 2017-06-27
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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[0005] The purpose of the present invention is to propose a stray light measurement device and measurement method to solve the technical problems of stray light transmission path positioning and stray light influence degree in large-aperture optical systems
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[0022] The optical path diagram of stray light measurement in the optical system is as follows: figure 1 shown. The entrance partition of the optical system depends on the size of the laser beam aperture and the structure of the optical system. For example, for a rotationally symmetric optical structure, an annular zone is used. During the measurement, only a small area on any annular zone in a certain radial direction To measure, see figure 2 ; For example, for a plane-symmetrical off-axis optical system, and the laser beam aperture is much smaller than the entrance aperture of the optical system, the symmetrical semi-entrance grid method is adopted for point measurement, see image 3 .
[0023] The specific implementation method of measurement is as follows:
[0024] 1. According to the size of the laser beam aperture and the structure of the optical system, design the measurement aperture area and distribution, and number the measurement aperture position Ni (1: N), des...
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The invention discloses a stray light measurement device and a measurement method. The measurement device comprises a laser and a detector. The laser has light of a test wave band and light of a positioning wave band, and light of the two wave bands is emitted in the same direction with the same aperture. The measurement wave band of the laser and the response wave band of the detector are located in a concern wave band range of a to-be-measured optical system, and the detector covers the measurement wave band of the laser. In the case of measurement, the entrance of the optical system is partitioned, the included angle of a light beam emitted by the laser in relative to the optical axis direction of the optical system is adjusted, the detector placed on the image plane of the optical system is used, light energy of the light beam emitted by the laser in the opening state arriving at the image plane is detected, stray light influence degree measurement in conditions of the aperture position and the off-axis angle is completed, and the stray light influence degree in the off-axis angle condition is acquired through aperture integral. The stray light measurement device and the measurement method have the advantages that the principle is simple, the device and the method can be universally used for optical system with various apertures, and the one-time scattering position route of the stray light can be intuitively positioned.
Description
technical field [0001] The invention belongs to the performance test technology in the development process of an optical system, and specifically relates to a stray light measuring device and a measuring method, which are used for the preliminary test of the stray light influence degree of the optical system and the positioning of the stray light influence path. Background technique [0002] With the wide application of image data of space optical remote sensing technology, the quantitative requirements for space optical remote sensing data are getting higher and higher. Therefore, to test the influence degree of stray light in the optical system of space optical remote sensing instruments, and to locate the transmission path of stray light, It is a necessary test item in the development process of space optical remote sensing instruments. [0003] The commonly used stray light test and evaluation method at home and abroad is the point source transmittance test method. This ...
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IPC IPC(8): G01M11/00
Inventor 于清华孙胜利
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI