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A Method of Detecting Spectral Characteristic Peaks Using Wavelet Calculation Derivatives

A technology of spectral features and first-order derivatives, applied in the field of spectral processing, can solve the problems of wave peak distortion, peak height reduction, high-order derivative large noise, etc., to achieve the effect of convenient and accurate calculation

Active Publication Date: 2018-01-02
SOUTHEAST UNIV
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  • Claims
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Problems solved by technology

However, the derivative method is seriously affected by the signal-to-noise ratio. Even if the derivative is smoothed and denoised before the calculation of the higher-order derivative, there will still be excessive noise in the higher-order derivative.
Moreover, filtering often causes peak distortion, reducing peak height and increasing peak width

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  • A Method of Detecting Spectral Characteristic Peaks Using Wavelet Calculation Derivatives
  • A Method of Detecting Spectral Characteristic Peaks Using Wavelet Calculation Derivatives
  • A Method of Detecting Spectral Characteristic Peaks Using Wavelet Calculation Derivatives

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Embodiment Construction

[0028] Taking energy dispersive X-ray fluorescence spectroscopy as an example, the technical solution of the present invention will be further described in combination with the accompanying drawings and embodiments. The steps of the method include:

[0029] Step 1. Obtain the X-ray fluorescence spectrum, which is denoted as f, and its spectrogram is as figure 2 shown. Since the effective information of the spectrum only exists in the [500,1600] interval, the wavelet transform is only performed on the spectrum in this interval during spectral analysis.

[0030] Step 2. Calculate the Gaussian function The fourth derivative of , get the function gaus4, and normalize it, after normalization ||gau4|| 2 =1.

[0031] Step 3. Use gaus4 as the wavelet basis function to perform 7-layer continuous wavelet transform on the spectrum f. The wavelet transform coefficient curve is consistent with the spectrum direction of the fourth-order derivative of the spectrum. Directly use the wav...

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Abstract

The invention discloses a method for calculating the characteristic peak of a derivative detection spectrum through using a wavelet. The method comprises the following steps: respectively carrying out continuous wavelet transformation on spectra through using the first derivative and the fourth derivative of a Gaussian function as wavelet basis functions, extracting a maximum point position from the wavelet calculation fourth derivative spectrum of gaus4 to obtain the position of an original spectrum peak, and extracting extreme point positions from the wavelet calculating first derivative spectrum of gaus1 to obtain the inflection point positions of the original spectrum peak. Characteristic points are obtained through detecting extreme points, so the method is more convenient and accurate than zero-crossing point calculation.

Description

technical field [0001] The invention relates to a method for detecting spectrum characteristic peaks by using wavelet calculation derivatives, belonging to the technical field of spectrum processing. technical background [0002] In the field of spectrum processing technology, the peak positions and net peak areas of characteristic peaks often contain important information. Taking energy dispersive X-ray fluorescence spectroscopy as an example, the accurate detection of characteristic peaks is the key to obtaining effective information such as the type and content of elements contained in the sample. However, various interferences are unavoidable in the generation of fluorescence spectra, resulting in X-ray fluorescence spectra not only containing effective information such as characteristic peaks, but also other high-frequency noise and low-frequency background. Since the energy dispersive X-ray fluorescence spectrum contains the K series, L series, and M series characteri...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223G06F19/00
Inventor 王玲赵奉奎王汉森王爱民
Owner SOUTHEAST UNIV