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Equipment, method and device for detecting thickness of measured object

A technology of objects and equipment, which is applied in the field of thickness detection, can solve problems such as the inability to accurately detect the thickness of objects

Active Publication Date: 2019-02-26
WEIHAI HUALING OPTO ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Embodiments of the present invention provide a device, method and device for detecting the thickness of a measured object, so as to at least solve the technical problem that the prior art cannot accurately detect the thickness of the object

Method used

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  • Equipment, method and device for detecting thickness of measured object
  • Equipment, method and device for detecting thickness of measured object
  • Equipment, method and device for detecting thickness of measured object

Examples

Experimental program
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Embodiment 1

[0036] figure 1 is a schematic diagram of a device for detecting the thickness of a measured object according to an embodiment of the present invention, such as figure 1 As shown, the device may include: a parallel plate capacitor 10 , a sampling device 30 and a processing device 50 .

[0037] Wherein, the parallel plate capacitor 10 includes correspondingly arranged charged electrodes 11 and detection electrode pairs. Such as figure 1 The detection electrode 12 and the detection electrode 13 in the composition form a detection electrode pair.

[0038] The sampling device 30 is connected with the detection electrode pair, and is used for sampling the two voltage signals of the detection electrode pair when the measured object passes between the charged electrode and the detection electrode pair.

[0039] The processing device 50 is connected with the sampling device, and is used for determining the thickness of the measured object based on the two voltage signals.

[0040]...

Embodiment 2

[0067] According to an embodiment of the present invention, an embodiment of a method for detecting the thickness of a measured object is provided. It should be noted that the steps shown in the flow chart of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, Also, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0068] Figure 5 is a flowchart of a method for detecting the thickness of a measured object according to an embodiment of the present invention, such as Figure 5 As shown, the method includes the following steps:

[0069] Step S501 , when the measured object passes between the charged electrode of the parallel plate capacitor and the detection electrode pair, two voltage signals of the detection electrode pair are sampled.

[0070] Step S503, determining the thickness of the meas...

Embodiment 3

[0098] Figure 8 is a schematic diagram of a device for detecting the thickness of a measured object according to an embodiment of the present invention, such as Figure 8 As shown, the device may include: a sampling unit 20 and a determining unit 40 .

[0099] Wherein, the sampling unit 20 is used for sampling two voltage signals of the detection electrode pair when the measured object passes between the charged electrode of the parallel plate capacitor and the detection electrode pair.

[0100] The determining unit 40 is configured to determine the thickness of the measured object based on the two voltage signals.

[0101] Adopting the embodiment of the present invention, through the principle of parallel plate capacitance, when the measured object passes between the charged electrode of the parallel plate capacitor and the detection electrode pair, the thickness of the measured object is determined according to the voltage change signal between the two plates, which solves...

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Abstract

The invention discloses an equipment, method and device for detecting thickness of a measured object. The equipment comprises a parallel plate capacitor including a charged electrode and a detection electrode couple which are arranged correspondingly; a sampling device in connection with the electrode couple, and used for sampling two voltage signals of the detection electrode couple when a measured object passes between the charged electrode and the detection electrode couple; and a processing device in connection with the sampling device, and used for determining the thickness of the measured object based on two voltage signals. According to the invention, the thickness of a measured object can be accurately detected so as to determine whether foreign matters exist on the object; the equipment has the characteristics of small size and light weight.

Description

technical field [0001] The invention relates to the field of thickness detection, in particular to a device, method and device for detecting the thickness of a measured object. Background technique [0002] In the field of banknote identification, banknote counters, banknote detectors, and sorting machines can identify the authenticity of banknotes by various means. While identifying the authenticity of banknotes, they can also measure the thickness of banknotes online. When there is foreign matter, especially scotch tape, it is often impossible to accurately determine whether there is foreign matter on the banknote by means of optical and magnetic detection. [0003] In order to judge whether there is foreign matter on the banknote based on the accurate detection of the thickness of the banknote, the contact method is generally used at present, that is, the banknote passes through the pressure wheel, and the displacement of the pressure wheel drives the change of the magnet...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G07D7/16
Inventor 林永辉张凯
Owner WEIHAI HUALING OPTO ELECTRONICS CO LTD
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