NIR (near infrared spectrum) analysis device and method for large-particle material
A technology of near-infrared spectroscopy and analysis equipment, which is applied in the direction of material analysis, measurement equipment, and analysis materials through optical means, can solve problems such as inconsistency, uneven samples, and enlarge the difference between online samples and sampled samples, and achieve small errors, high precision effect
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Embodiment 1
[0039] figure 1 Schematically provides a simplified structural diagram of the near-infrared spectrum analysis device for large particle materials in the embodiment of the present invention, as figure 1 Shown, described near-infrared spectrum analysis device comprises:
[0040] Sampling unit 2, which is used to intermittently grab and sample the sample to be tested from the material conveyor 1, and transfer it to the collection unit;
[0041] Collection unit 3, such as a hopper, which is used to collect the sample to be tested after sampling and send it to the crushing unit;
[0042] Valve 31, the valve is installed on the connecting channel of the collection unit and the crushing unit;
[0043] A pulverizing unit 4, the pulverizing unit is used to pulverize the sent sample to be tested, and the pulverized sample to be tested is sent to an analysis instrument for analysis;
[0044] A mixing unit, such as a stirrer, the mixing unit is arranged in the pulverizing unit for mixi...
Embodiment 2
[0054] figure 2 Schematically provides a simplified structural diagram of the near-infrared spectrum analysis device for large particle materials in the embodiment of the present invention, as figure 2 Shown, described near-infrared spectrum analysis device comprises:
[0055] Sampling unit 12, the sampling unit is arranged obliquely, and the input port is arranged in the vertical material pipeline 11 for sampling the sample to be tested and sent to the collection unit; valve 13 is installed on the sampling unit 12 for intermittent sampling;
[0056] Collection unit 3, such as a hopper, which is used to collect the sample to be tested after sampling and send it to the crushing unit;
[0057] Valve 31, the valve is installed on the connecting channel of the collection unit and the crushing unit;
[0058] A pulverizing unit 4, the pulverizing unit is used to pulverize the sent sample to be tested, and the pulverized sample to be tested is sent to an analysis instrument for a...
Embodiment 3
[0069] image 3 Schematically provides a simplified structural diagram of the near-infrared spectrum analysis device for large particle materials in the embodiment of the present invention, as image 3 Shown, described near-infrared spectrum analysis device comprises:
[0070] Sampling unit 12, the sampling unit is arranged obliquely, and the input port is arranged in the vertical material pipeline 11 for sampling the sample to be tested and sent to the collection unit; valve 13 is installed on the sampling unit 12 for intermittent sampling;
[0071] Collection unit 3, such as a hopper, which is used to collect the sample to be tested after sampling and send it to the crushing unit;
[0072] Valve 31, the valve is installed on the connecting channel of the collection unit and the crushing unit;
[0073] A pulverizing unit 4, the pulverizing unit is used to pulverize the sent sample to be tested, and the pulverized sample to be tested is sent to an analysis instrument for ana...
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