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NIR (near infrared spectrum) analysis device and method for large-particle material

A technology of near-infrared spectroscopy and analysis equipment, which is applied in the direction of material analysis, measurement equipment, and analysis materials through optical means, can solve problems such as inconsistency, uneven samples, and enlarge the difference between online samples and sampled samples, and achieve small errors, high precision effect

Inactive Publication Date: 2016-03-30
FOCUSED PHOTONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the process of industrial production, the use of near-infrared spectroscopy analysis method for online detection of non-uniform solid samples has the following problems: 1. A good online analysis model of near-infrared spectroscopy cannot be established; 2. The near-infrared online detection value is inconsistent with the offline detection value after sampling. Low accuracy of online analysis results
Due to the continuity of the production process, the near-infrared online instrument scans samples within a period of time, while sampling is only a sample at one time point. The samples analyzed online are inconsistent with the samples analyzed by sampling. At the same time, due to the unevenness of the samples themselves, Expanded the difference between online samples and sampling samples

Method used

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  • NIR (near infrared spectrum) analysis device and method for large-particle material
  • NIR (near infrared spectrum) analysis device and method for large-particle material
  • NIR (near infrared spectrum) analysis device and method for large-particle material

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Experimental program
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Embodiment 1

[0039] figure 1 Schematically provides a simplified structural diagram of the near-infrared spectrum analysis device for large particle materials in the embodiment of the present invention, as figure 1 Shown, described near-infrared spectrum analysis device comprises:

[0040] Sampling unit 2, which is used to intermittently grab and sample the sample to be tested from the material conveyor 1, and transfer it to the collection unit;

[0041] Collection unit 3, such as a hopper, which is used to collect the sample to be tested after sampling and send it to the crushing unit;

[0042] Valve 31, the valve is installed on the connecting channel of the collection unit and the crushing unit;

[0043] A pulverizing unit 4, the pulverizing unit is used to pulverize the sent sample to be tested, and the pulverized sample to be tested is sent to an analysis instrument for analysis;

[0044] A mixing unit, such as a stirrer, the mixing unit is arranged in the pulverizing unit for mixi...

Embodiment 2

[0054] figure 2 Schematically provides a simplified structural diagram of the near-infrared spectrum analysis device for large particle materials in the embodiment of the present invention, as figure 2 Shown, described near-infrared spectrum analysis device comprises:

[0055] Sampling unit 12, the sampling unit is arranged obliquely, and the input port is arranged in the vertical material pipeline 11 for sampling the sample to be tested and sent to the collection unit; valve 13 is installed on the sampling unit 12 for intermittent sampling;

[0056] Collection unit 3, such as a hopper, which is used to collect the sample to be tested after sampling and send it to the crushing unit;

[0057] Valve 31, the valve is installed on the connecting channel of the collection unit and the crushing unit;

[0058] A pulverizing unit 4, the pulverizing unit is used to pulverize the sent sample to be tested, and the pulverized sample to be tested is sent to an analysis instrument for a...

Embodiment 3

[0069] image 3 Schematically provides a simplified structural diagram of the near-infrared spectrum analysis device for large particle materials in the embodiment of the present invention, as image 3 Shown, described near-infrared spectrum analysis device comprises:

[0070] Sampling unit 12, the sampling unit is arranged obliquely, and the input port is arranged in the vertical material pipeline 11 for sampling the sample to be tested and sent to the collection unit; valve 13 is installed on the sampling unit 12 for intermittent sampling;

[0071] Collection unit 3, such as a hopper, which is used to collect the sample to be tested after sampling and send it to the crushing unit;

[0072] Valve 31, the valve is installed on the connecting channel of the collection unit and the crushing unit;

[0073] A pulverizing unit 4, the pulverizing unit is used to pulverize the sent sample to be tested, and the pulverized sample to be tested is sent to an analysis instrument for ana...

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Abstract

The invention provides an NIR (near infrared spectrum) analysis device and method for a large-particle material. The NIR analysis device comprises an analysis meter, a sampling unit, a grinding unit and a sample reserving unit, wherein the sampling unit is used for sampling a to-be-tested sample and sending the to-be-tested sample to the grinding unit; the grinding unit is used for grinding the received to-be-tested sample, and the to-be-tested sample after grinding is sent to the analysis meter for analysis; the sample reserving unit is mounted at the downstream part of the grinding unit and used for reserving the to-be-tested sample after analysis. The NIR analysis device and method for the large-particle material have the advantages of high precision and the like.

Description

technical field [0001] The invention relates to the field of near-infrared spectrum analysis, in particular to a near-infrared spectrum analysis device and method for large particle materials. Background technique [0002] In the process of industrial production, the use of near-infrared spectroscopy analysis method for online detection of non-uniform solid samples has the following problems: 1. A good online analysis model of near-infrared spectroscopy cannot be established; 2. The near-infrared online detection value is inconsistent with the offline detection value after sampling. The accuracy of online analysis results is low. (In actual production, the accuracy of online detection data is generally measured based on sampling offline detection data, so it is considered that the accuracy of online analysis data is low.) [0003] The reason for the above problem is that the sample for online spectral scanning and the sample for sampling analysis are not the same sample. D...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/359G01N21/3563
CPCG01N21/359G01N21/3563
Inventor 周新奇韩双来郭中原杨伟伟陈胜福慎石磊张丹胡杰吴键波
Owner FOCUSED PHOTONICS