A kind of preparation method of n-type copper oxide film
A copper oxide, thin film technology, applied in ion implantation plating, metal material coating process, coating and other directions, to achieve good repeatability, good crystallinity and high purity
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Embodiment 1
[0015] Ordinary glass substrates were ultrasonically cleaned in acetone, ethanol, and deionized water for 5 minutes in sequence, and dried with nitrogen. Weigh 2 g of copper oxide powder (content ≥ 99.9%), put it in a metal mold with a diameter of 2 cm and press the target with a tablet press to obtain a copper oxide target. The cleaned ordinary glass substrate and copper oxide target are transported to the deposition chamber of the laser pulse deposition equipment by a robot, and the deposition chamber is evacuated to 1×10 with a mechanical pump and a molecular pump. -4 Pa, adjust the distance between the glass substrate and the copper oxide target to be 6cm, then heat the glass substrate to 500°C, then open the oxygen vent valve, feed oxygen into the deposition chamber, and turn on the mass flow meter to control the oxygen flow to 18sccm, Adjust the pressure of the deposition chamber to 8Pa. Use a KrF excimer pulse laser with a wavelength of 248nm to adjust the optical path...
Embodiment 2
[0018] In this example, the pressure of the deposition chamber is adjusted to 12Pa, and other steps are the same as in Example 1 to obtain an n-type copper oxide film with a thickness of 220nm (see image 3 ). The electron concentration of the copper oxide film measured by the Hall effect measuring instrument is 5.5×10 15 cm -3 , The mobility is 1.0cm 2 / Vs, resistivity 7.9×10 2 Ω·cm, and its Hall coefficient is negative, indicating that the film is an n-type copper oxide film.
Embodiment 3
[0020] In this embodiment, the substrate used is a quartz glass substrate, and the heating temperature of the substrate is 600°C. The other steps are the same as in Embodiment 1 to obtain an n-type copper oxide film with a thickness of 250nm (see Figure 4 ). The electron concentration of the copper oxide film measured by the Hall effect measuring instrument is 2.8×10 15 cm -3 , The mobility is 3.9cm 2 / Vs, resistivity 6.4×10 2 Ω·cm, and its Hall coefficient is negative, indicating that the film is an n-type copper oxide film.
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