Unlock instant, AI-driven research and patent intelligence for your innovation.

A reaction chamber and semiconductor processing equipment

A reaction chamber and semiconductor technology, applied in metal material coating process, ion implantation plating, coating, etc., can solve problems such as device performance impact, improve process quality, improve chip yield, improve process quality and The Effect of Chip Yield

Active Publication Date: 2018-05-25
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention aims to solve the technical problems existing in the prior art, and provides a reaction chamber and semiconductor processing equipment. Therefore, under the premise of realizing the pre-cleaning of the surface of the substrate with the help of hydrogen radicals, it can solve the problems of hydrogen ions It is easy to enter the problem that Low-K materials affect the performance of the device, so that the process quality and chip yield can be improved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A reaction chamber and semiconductor processing equipment
  • A reaction chamber and semiconductor processing equipment
  • A reaction chamber and semiconductor processing equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the reaction chamber and semiconductor processing equipment provided by the present invention will be described in detail below with reference to the accompanying drawings.

[0027] figure 2 A schematic diagram of the first structure of the reaction chamber provided by the embodiment of the present invention. see figure 2 , the reaction chamber 20 provided in this embodiment includes a supporting device 21 and a plasma generating device. The carrying device 21 is used to carry the substrate, the plasma generating device is used to excite the gas in the reaction chamber 20 to form plasma, and the carrying device 21 is arranged below the plasma generating device. Specifically, in this embodiment, the plasma generating device is an inductively coupled plasma generating device, the inductively coupled plasma generating device includes an induction coil 22, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
Login to View More

Abstract

The present invention provides a reaction chamber and semiconductor processing equipment. The reaction chamber includes a carrying device, a plasma generating device and a metal plate. Plasma is excited to form, the supporting device is arranged below the plasma generating device; the metal plate is horizontally arranged between the supporting device and the plasma generating device, and a plurality of through holes are provided on the metal plate through its thickness, and the metal plate and The DC power supply is electrically connected to apply a positive voltage to the metal plate to repel ions above the metal plate from diffusing toward the carrying device through the through hole. The reaction chamber provided by the present invention can solve the problem that hydrogen ions easily enter Low-K materials and affect the performance of devices, thereby improving process quality and chip yield.

Description

technical field [0001] The invention belongs to the field of semiconductor equipment manufacturing, and in particular relates to a reaction chamber and semiconductor processing equipment. Background technique [0002] Physical vapor deposition (hereinafter referred to as PVD) equipment usually includes a pre-cleaning chamber in the application of integrated circuit IC, through-silicon via TSV, packaging and packaging, and is used to complete the pre-cleaning process on the substrate or workpiece in the chamber. The basic principle of the so-called pre-cleaning process is to excite a gas (such as argon, helium, hydrogen, etc.) to form a plasma, and then use the plasma to chemically react and / or physically bombard the substrate or workpiece to remove the substrate. Or impurities on the surface of the workpiece. [0003] figure 1 It is a structural schematic diagram of an existing pre-cleaning chamber. see figure 1 , the pre-cleaning chamber 10 includes a carrier device 11 ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): C23C14/02C23C14/22
Inventor 陈鹏
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD