Charge compensation method based on interline overlap
A charge compensation and line-to-line technology, applied in circuits, electrical components, electric solid-state devices, etc., can solve the problems of small dynamic range, long sampling time, etc., to improve the frame rate, shorten the coupling time window, and reduce the line scanning time Effect
Active Publication Date: 2016-06-08
SHANGHAI IRAY TECH
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Problems solved by technology
[0018] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a charge compensation method based on inter-line overlap, which is used to solve the problem of long sampling time and small dynamic range in the prior art solution to the TFT charge injection effect. , Need to read chip support and other issues
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[0049] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
[0050] see Figure 6 ~ Figure 7 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arbi...
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The invention provides a charge compensation method based on interline overlap. The method comprises the steps of switching on a first line switch transistor of an amorphous TFT array, wherein the first line of the amorphous TFT array is a false pixel line; switching on a second line switch transistor of the amorphous TFT array and simultaneously switching off the first line switch transistor, wherein an impact current which is generated at the switching-on instant of the second line switch transistor counteracts an impact current that is generated at the switching-off instant of the first line switch transistor, and afterwards acquiring photogenerated charges in a photodiode which is connected with the second line switch transistor; successively switching on a current line switch transistor and simultaneously switching off the former line switch transistor, and after counteracting of the impact currents which are respectively generated at the switching-on instant and the switching-off instant of the switch tube, acquiring the photogenerated charges in the photodiode which is connected with the current line switch transistor. The charge compensation method based on interline overlap has advantages of eliminating a zero-value problem in a dark field and small dosage, improving frame rate, enlarging dynamic range, and reducing coupling time window, line scanning time and noise.
Description
technical field [0001] The invention relates to the field of flat panel detection, in particular to an electric charge compensation method based on overlapping between rows. Background technique [0002] Such as figure 1 As shown, the X-ray flat panel detector 1 generally adopts an amorphous silicon TFT (ThinFilm Transistor, thin film transistor) 11 as a photosensitive surface, converts the X-rays passing through the photographed object into photogenerated charges, and converts the charges into voltages through a transconductance integrating amplifier 12 The signal is then converted into a digital image by correlated double sampling and ADC sampling 13 . [0003] The grayscale of the image is as follows: [0004] s i g n a l = Q C f / l s b = E S ...
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IPC IPC(8): H01L27/146
CPCH01L27/14612H01L27/14658
Inventor 林言成于祥国
Owner SHANGHAI IRAY TECH